Scanning near-field optical microscope probes: Fabrication and properties

被引：0
|
作者：
Dryakhlushin, V. F. [1 ]
机构：
[1] RAS, Inst Phys Microstruct, Nizhnii Novgorod 603950, Russia
来源：
2005 15th International Crimean Conference Microwave & Telecommunication Technology, Vols 1 and 2, Conference Proceedings | 2005年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The method of scanning near-field optical microscope (SNOM) probe fabrication with high transmission coefficients on the base of tapered single-mode optical fiber are studied. The various methods of improvement of resolution of SNOM and application for modification and diagnostics of sample surface are discussed.
引用
收藏
页码：603 / 604
页数：2
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