共 50 条
- [41] Annealing characteristics of ultra-thin high-K HfO2 gate dielectrics CHINESE PHYSICS, 2003, 12 (03): : 325 - 327
- [43] Improved Characteristics for OTFT with HfO2 Gate Dielectric by Using Chlorinated Indium Tin Oxide Gate Electrode 2016 IEEE INTERNATIONAL CONFERENCE ON ELECTRON DEVICES AND SOLID-STATE CIRCUITS (EDSSC), 2016, : 365 - 368
- [45] Performance Improvement in 4H-SiC UMOSFET with HfO2/Al2O3 Gate Dielectric Stack PROCEEDINGS OF 2ND INTERNATIONAL CONFERENCE ON 2017 DEVICES FOR INTEGRATED CIRCUIT (DEVIC), 2017, : 804 - 807
- [48] Complex impedance spectroscopy of high-k HfO2 thin films in Al/HfO2/Si capacitor for gate oxide applications Journal of Materials Science: Materials in Electronics, 2015, 26 : 3506 - 3514
- [50] Technology breakthrough by ferroelectric HfO2 for low power logic and memory applications SEMICONDUCTORS, DIELECTRICS, AND METALS FOR NANOELECTRONICS 16, 2018, 86 (02): : 21 - 25