Optimal design for a high performance H-JLTFET using HfO2 as a gate dielectric for ultra low power applications

被引:24
|
作者
Asthana, Pranav Kumar [1 ]
Ghosh, Bahniman [1 ,2 ]
Rahi, Shiromani Bal Mukund [1 ]
Goswami, Yogesh [1 ]
机构
[1] Indian Inst Technol, Dept Elect Engn, Kanpur 208016, Uttar Pradesh, India
[2] Univ Texas Austin, Microelect Res Ctr, Austin, TX USA
关键词
SHORT-CHANNEL; FIELD; TRANSISTORS;
D O I
10.1039/c4ra00538d
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
In this paper we have proposed an optimal design for a hetero- junctionless tunnel field effect transistor (TFET) using HfO2 as a gate dielectric. The device principle and performance are investigated using a 2D simulator. During this work, we investigated the transfer characteristics, output characteristics, transconductance, Gm, output conductance, GD, and C-V characteristics of our proposed device. Numerical simulations resulted in outstanding performance of the H-JLTFET resulting in I-ON of similar to 0.23 mA mu m(-1), I-OFF of similar to 2.2 x 10(-17) A mu m-(1,) I-ON/I-OFF of similar to 10(13), sub-threshold slope (SS) of similar to 12 mV dec(-1) , DIBL of similar to 93 mV V-1 and V-th of similar or equal to 0.11 V at room temperature and VDD of 0.7 V. This indicates that the H-JLTFET can play an important role in the further development of low power switching applications.
引用
收藏
页码:22803 / 22807
页数:5
相关论文
共 50 条
  • [41] Annealing characteristics of ultra-thin high-K HfO2 gate dielectrics
    Han, DD
    Kang, JF
    Lin, CH
    Han, RQ
    CHINESE PHYSICS, 2003, 12 (03): : 325 - 327
  • [42] Mobility enhancement in TaN metal-gate MOSFETs using tantalum incorporated HfO2 gate dielectric
    Yu, XF
    Zhu, CX
    Li, MF
    Chin, A
    Yu, MB
    Du, AY
    Kwong, DL
    IEEE ELECTRON DEVICE LETTERS, 2004, 25 (07) : 501 - 503
  • [43] Improved Characteristics for OTFT with HfO2 Gate Dielectric by Using Chlorinated Indium Tin Oxide Gate Electrode
    Tang, W. M.
    Helander, M. G.
    Greiner, M. T.
    Lu, Z. H.
    Ng, W. T.
    2016 IEEE INTERNATIONAL CONFERENCE ON ELECTRON DEVICES AND SOLID-STATE CIRCUITS (EDSSC), 2016, : 365 - 368
  • [44] High performance AlGaN/GaN power switch with HfO2 insulation
    Shi, Junxia
    Eastman, Lester F.
    Xin, Xiaobin
    Pophristic, Milan
    APPLIED PHYSICS LETTERS, 2009, 95 (04)
  • [45] Performance Improvement in 4H-SiC UMOSFET with HfO2/Al2O3 Gate Dielectric Stack
    Bharti, Deepshikha
    Islam, Aminul
    PROCEEDINGS OF 2ND INTERNATIONAL CONFERENCE ON 2017 DEVICES FOR INTEGRATED CIRCUIT (DEVIC), 2017, : 804 - 807
  • [46] Achieving excellent ferroelectric and dielectric performance of HfO2/ZrO2/HfO2 thin films under low operating voltage
    Yan, Fei
    Liao, Jiajia
    Cao, Ke
    Jia, Shijie
    Zhou, Yichun
    Liao, Min
    JOURNAL OF ALLOYS AND COMPOUNDS, 2023, 968
  • [47] Complex impedance spectroscopy of high-k HfO2 thin films in Al/HfO2/Si capacitor for gate oxide applications
    Nath, Madhuchhanda
    Roy, Asim
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2015, 26 (06) : 3506 - 3514
  • [48] Complex impedance spectroscopy of high-k HfO2 thin films in Al/HfO2/Si capacitor for gate oxide applications
    Madhuchhanda Nath
    Asim Roy
    Journal of Materials Science: Materials in Electronics, 2015, 26 : 3506 - 3514
  • [49] A high performance MIM capacitor using HfO2 dielectrics
    Hu, H
    Zhu, CX
    Lu, YF
    Li, MF
    Cho, BJ
    Choi, WK
    IEEE ELECTRON DEVICE LETTERS, 2002, 23 (09) : 514 - 516
  • [50] Technology breakthrough by ferroelectric HfO2 for low power logic and memory applications
    Kobayashi, Masaharu
    SEMICONDUCTORS, DIELECTRICS, AND METALS FOR NANOELECTRONICS 16, 2018, 86 (02): : 21 - 25