Microstructural characterization of polycrystalline materials by synchrotron X-rays

被引：27
|
作者：
Wang, Leyun [1 ]
Li, Meimei [1 ]
Almer, Jonathan [2 ]
Bieler, Thomas [3 ]
Barabash, Rozaliya [4 ]
机构：
[1] Argonne Natl Lab, Nucl Engn Div, Lemont, IL 60439 USA
[2] Argonne Natl Lab, Xray Sci Div, Lemont, IL 60439 USA
[3] Michigan State Univ, Dept Chem Engn & Mat Sci, E Lansing, MI 48824 USA
[4] Oak Ridge Natl Lab, Mat Sci & Technol Div, Oak Ridge, TN 37831 USA
来源：
FRONTIERS OF MATERIALS SCIENCE | 2013年 / 7卷 / 02期
基金：
美国国家科学基金会;
关键词：
differential-aperture X-ray microscopy (DAXM); three-dimensional X-ray diffraction (3DXRD); wide angle/small angle X-ray scattering (WAXS/SAXS); ELECTRON BACKSCATTERED DIFFRACTION; IN-SITU; GRAIN-BOUNDARIES; HETEROGENEOUS DEFORMATION; INDIVIDUAL GRAINS; STRAIN TENSOR; MICROSCOPY; STEEL; MICRODIFFRACTION; ORIENTATION;
D O I：
10.1007/s11706-013-0201-0
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Third generation synchrotron X-rays provide an unprecedented opportunity for microstructural characterization of many engineering materials as well as natural materials. This article demonstrates the usage of three techniques for the study of structural materials: differential-aperture X-ray microscopy (DAXM), three-dimensional X-ray diffraction (3DXRD), and simultaneous wide angle/small angle X-ray scattering (WAXS/SAXS). DAXM is able to measure the 3D grain structure in polycrystalline materials with high spatial and angular resolution. In a deformed material, streaked diffraction peaks can be used to analyze local dislocation content in individual grains. Compared to DAXM, 3DXRD is able to map grains in bulk materials more quickly at the expense of spatial resolution. It is very useful for studying evolving microstructures when the materials are under deformation. WAXS/SAXS is suitable for studying materials with inhomogeneous structure, such as precipitate strengthened alloys. Structural information revealed by WAXS and SAXS can be combined for a deeper insight into material behavior. Future development and applications of these three techniques will also be discussed.
引用
收藏
页码：156 / 169
页数：14
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