A 28nm 6T SRAM memory compiler with a variation tolerant replica circuit

被引:0
|
作者
Gupta, Sharad [1 ]
Rana, Parvindcr Kumar [1 ]
机构
[1] Texas Instruments India Pvt Ltd, External Dev & Mfg, Bangalore, Karnataka, India
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中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
we propose an SRAM replica tracking circuit that reduces divergence of the replica path relative to normal read path (6-16% less Sense differential Requirement), thus improving the access time by 5-8%. The approach is compatible to power managed SRAMs having Retain till Access feature and also for non power managed SRAMs with no sense differential impact. Using This Replica tracing circuit Sense differential has been well tracked across all array and periphery voltages combinations which further improve the access time by 4-6%. Instances with this method 0.5-256Kb have been tested on a 28nm CMOS LP process.
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页码:458 / 461
页数:4
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