Materials and process challenges in high resolution lithography.

被引:0
|
作者
Angelopoulos, M [1 ]
Mahorowala, A [1 ]
Babich, K [1 ]
Goldfarb, D [1 ]
Pfeiffer, D [1 ]
Huang, WS [1 ]
Lin, QH [1 ]
Medeiros, D [1 ]
机构
[1] IBM Corp, Thomas J Watson Res Ctr, Adv Lithog Dept, Yorktown Hts, NY 10598 USA
关键词
D O I
暂无
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
071-PMSE
引用
收藏
页码:U499 / U499
页数:1
相关论文
共 50 条
  • [21] NEW MATERIALS FOR HIGH-RESOLUTION OPTICAL LITHOGRAPHY
    MILLER, RD
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1985, 190 (SEP): : 60 - INE
  • [22] A metric for process optimisation on substrates with transparent stacks in optical lithography.
    Martin, B
    Arthur, G
    METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XIV, 2000, 3998 : 641 - 647
  • [23] Photocurable resists for imprint lithography.
    Carter, KR
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2005, 229 : U1119 - U1119
  • [24] POLYSILOXANES FOR DEEP UV LITHOGRAPHY.
    Shaw, J.M.
    Hatzakis, M.
    Parasczcak, J.
    Bagbich, E.
    Microelectronic Engineering, 1985, 3 (1-4) : 293 - 304
  • [25] Maximising the process window in sub-half-micron optical lithography.
    Arthur, G
    Martin, B
    Wallace, C
    MICROELECTRONIC ENGINEERING, 2000, 53 (1-4) : 145 - 148
  • [26] Tribological issues in nanoimprint lithography.
    McClelland, GM
    Rettner, CT
    Hart, MW
    Sanchez, MI
    Best, ME
    Terris, BD
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2004, 227 : U807 - U807
  • [27] High-resolution soft lithography: Enabling materials for nanotechnologies
    Rolland, JP
    Hagberg, EC
    Denison, GM
    Carter, KR
    DeSimone, JM
    ANGEWANDTE CHEMIE-INTERNATIONAL EDITION, 2004, 43 (43) : 5796 - 5799
  • [28] EFFECTS OF PHOTOELECTRONS AND AUGER ELECTRONS ON CONTRAST AND RESOLUTION IN X-RAY LITHOGRAPHY.
    SAITOH, YASUNAO
    YOSHIHARA, HIDEO
    WATANABE, IWAO
    1600, (V 21):
  • [29] PROXIMITY EFFECTS IN SUBMICRONIC LITHOGRAPHY.
    Izrael, A.
    Bellessa, J.
    Akamatsu, B.
    Microelectronic Engineering, 1985, 3 (1-4) : 371 - 378
  • [30] REDUCTION LENSES FOR SUBMICRON LITHOGRAPHY.
    Omata, Takashi
    1600, (27):