Near-field scanning optical microscopy for characterisation of photovoltaic materials

被引：1

作者：

van Dyk, EE ^{[1
]}

Karoui, A ^{[1
]}

La Rosa, AH ^{[1
]}

Rozgonyi, G ^{[1
]}

机构：

[1] Univ Port Elizabeth, Dept Phys, ZA-6031 Port Elizabeth, South Africa

来源：

CONFERENCE ON PHOTO-RESPONSIVE MATERIALS, PROCEEDINGS | 2004年

关键词：

D O I：

10.1002/pssc.200404848

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Near-field scanning optical microscopy (NSOM) enables nanometer scale studies of optical and opto-electronic properties. A NSOM setup has been designed and constructed to investigated carrier lifetime in the vicinity of extended defects such as grain boundaries and dislocations, as well as surface topography in photovoltaic materials. The benefits of the NSOM technique and the different modes employed are discussed. Some preliminary results are presented. (C) 2004 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

引用

页码：2292 / 2297

页数：6

共 50 条

[1] Near-field scanning optical microscopy studies of materials and devices
Hsu, JWP
MRS BULLETIN, 1997, 22 (08) : 27 - 30
[2] Near-Field Scanning Optical Microscopy Studies of Materials and Devices
J. W. P. Hsu
MRS Bulletin, 1997, 22 : 27 - 30
[3] Characterization of materials and devices by near-field scanning optical microscopy
Goldberg, BB
Ghaemi, HF
Unlu, MS
Herzog, WD
DIAGNOSTIC TECHNIQUES FOR SEMICONDUCTOR MATERIALS PROCESSING II, 1996, 406 : 171 - 182
[4] NEAR-FIELD SCANNING OPTICAL MICROSCOPY
MORRISON, GH
ANALYTICAL CHEMISTRY, 1989, 61 (19) : A1075 - A1075
[5] Near-field scanning - Optical microscopy
Shiku, H
Dunn, RC
ANALYTICAL CHEMISTRY, 1999, 71 (01) : 23A - 29A
[6] SCANNING NEAR-FIELD OPTICAL MICROSCOPY
HEINZELMANN, H
POHL, DW
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1994, 59 (02): : 89 - 101
[7] Near-field scanning optical microscopy
Buratto, SK
CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE, 1996, 1 (04): : 485 - 492
[8] Near-field scanning optical microscopy
Dunn, RC
CHEMICAL REVIEWS, 1999, 99 (10) : 2891 - +
[9] Scanning near-field optical microscopy
Kirstein, S
CURRENT OPINION IN COLLOID & INTERFACE SCIENCE, 1999, 4 (04) : 256 - 264
[10] Scanning near-field optical microscopy
Fokas, CS
NACHRICHTEN AUS CHEMIE TECHNIK UND LABORATORIUM, 1999, 47 (06): : 648 - +

← 1 2 3 4 5 →