共 50 条
- [46] ABSOLUTE DISTANCE MEASUREMENT BY WAVELENGTH SHIFT INTERFEROMETRY WITH A LASER DIODE - SOME SYSTEMATIC-ERROR SOURCES [J]. APPLIED OPTICS, 1987, 26 (09): : 1654 - 1660
- [47] Synthetic-wavelength-based dual-comb interferometry for fast and precise absolute distance measurement [J]. OPTICS EXPRESS, 2018, 26 (05): : 5747 - 5757
- [50] Absolute distance measurement with micrometer accuracy using a Michelson interferometer and the iterative synthetic wavelength principle [J]. OPTICS EXPRESS, 2012, 20 (05): : 5658 - 5682