Simulation of low-energy argon ion scattering from surface copper clusters

被引：0
|
作者：
Kornich, GV [1 ]
Betz, G
Zaporojtchenko, VI
Belaya, NI
机构：
[1] Zaporozhye Natl Tech Univ, UA-69063 Zaporozhe, Ukraine
[2] Vienna Tech Univ, Inst Allgemeine Phys, A-1040 Vienna, Austria
[3] Univ Kiel, Tech Fak, D-24143 Kiel, Germany
来源：
TECHNICAL PHYSICS LETTERS | 2004年 / 30卷 / 07期
关键词：
Copper; Reflection; Graphite; Argon; Molecular Dynamic;
D O I：
10.1134/1.1783396
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The scattering of normally incident 200-eV Ar+ ions from individual clusters consisting of 13 and 39 copper atoms on a (0001) graphite surface was simulated by the molecular dynamics method. The angular distribution of scattered argon ions and their energies and reflection coefficients are discussed. (C) 2004 MAIK "Nauka/Interperiodica".
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页码：545 / 547
页数：3
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