Simulation of low-energy argon ion scattering from surface copper clusters

被引：0

作者：

Kornich, GV ^{[1
]}

Betz, G

Zaporojtchenko, VI

Belaya, NI

机构：

[1] Zaporozhye Natl Tech Univ, UA-69063 Zaporozhe, Ukraine

[2] Vienna Tech Univ, Inst Allgemeine Phys, A-1040 Vienna, Austria

[3] Univ Kiel, Tech Fak, D-24143 Kiel, Germany

来源：

TECHNICAL PHYSICS LETTERS | 2004年 / 30卷 / 07期

关键词：

Copper; Reflection; Graphite; Argon; Molecular Dynamic;

D O I：

10.1134/1.1783396

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The scattering of normally incident 200-eV Ar+ ions from individual clusters consisting of 13 and 39 copper atoms on a (0001) graphite surface was simulated by the molecular dynamics method. The angular distribution of scattered argon ions and their energies and reflection coefficients are discussed. (C) 2004 MAIK "Nauka/Interperiodica".

引用

页码：545 / 547

页数：3

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