Grazing-incidence small-angle X-ray scattering applied to the characterization of aggregates in surface regions

被引:55
|
作者
Naudon, A
Babonneau, D
Thiaudière, D
Lequien, S
机构
[1] Univ Poitiers, Met Phys Lab, UMR 6630 CNRS, UFR Sci, F-86962 Futuroscope Chasseneuil, France
[2] European Synchrotron Radiat Facil, F-38043 Grenoble, France
[3] CEA Saclay, CEA CNRS, Lab Pierre Sue, F-91191 Gif Sur Yvette, France
来源
PHYSICA B | 2000年 / 283卷 / 1-3期
关键词
grazing incidence; X-ray scattering; thin film growth; ion assistance;
D O I
10.1016/S0921-4526(99)01894-3
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Ion-beam sputtering deposition has been used to elaborate discontinuous gold and granular carbon-platinum thin films. The morphology of the deposited gold islands and buried platinum clusters so obtained has been studied by grazing incidence small-angle X-ray scattering (GISAXS). The full potentiality of this non-destructive technique at grazing incidence is obtained when it is coupled with a synchrotron radiation beam and two-dimensional detectors. The influence of argon ion-implantation performed during Au or C-Pt growth has been studied. A relevant information to understand and control the structural properties of such materials is then achieved. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:69 / 74
页数:6
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