Development of Si/SiO2 super-lattices deposited by RF reactive sputtering

被引:0
|
作者
Boyd, E. [1 ]
Blaikie, R. J. [1 ]
机构
[1] Univ Canterbury, MacDiarmid Inst Adv Mat & Nanotechnol, Dept Elect & Comp Engn, Christchurch 8020, New Zealand
关键词
reactive; sputtering; silicon; silicon dioxide;
D O I
10.1016/j.cap.2005.11.045
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We report on the progress that has been made on the realisation of narrow spectrum photonic crystal filters operating in the communications band. The development of a process for the deposition of silicon-silicon dioxide super-lattices using RF reactive sputtering is described. The use of reactive sputtering of silicon dioxide from a silicon target enables a much higher deposition rate than could be achieved using a SiO2 target. The characteristics of these films are shown to closely match the widely accepted values for silicon dioxide over a wide range of wavelengths. The cross-sectional SEM micrograph of a super-lattice deposited in this manner is presented which shows clearly the alternating layers with well-defined interfaces. (c) 2005 Elsevier B.V. All rights reserved.
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页码:491 / 494
页数:4
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