A wide lock-in range PLL using self-calibrating technique for processors

被引:0
|
作者
Nakanishi, Jingo [1 ]
Notani, Hiromi [1 ]
Makino, Hiroshi [1 ]
Shinohara, Hirofumi [1 ]
机构
[1] Renesas Technol Corp, Adv Design Framework Dev Dept, Itami, Hyogo 6648641, Japan
关键词
D O I
10.1109/ASSCC.2005.251721
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A wide lock-in range PLL using a self-calibrating technique is proposed. This technique realizes a wide lock-in range and good jitter characteristics by performing the digital calibration at the start of the operation. However, self-calibration with a large number of digital control steps increases the test costs and circuit scale. In this paper, by estimating the margin for self-calibrating operation, the minimum number of digital control steps was determined. A PLL with a low test cost, a wide lock-in range and low jitter was designed and implemented using a 0.15 mu m 1.5 V CMOS process. The measured PLL lock-in range is 80 MHz - 630 MHz with four digital calibration steps. The peak-to-peak jitter at 380 MHz is 100 ps.
引用
收藏
页码:285 / 288
页数:4
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