SoCs with MEMS ? Can we include MEMS in the SoCs design and test flow ?

被引：0
|
作者：
Mir, S
Kerkhoff, H
Blanton, RD
Bederr, H
Klim, H
机构：
来源：
20TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS | 2002年
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暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
Recent developments in the field of MEMS indicate a clear move toward systems, rather than just individual components. Design and fabrication of these components include new methods and techniques. Does testing require new methodologies and tools ? Will we be able to include MEMS in the SoCs flow?
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页码：449 / 449
页数：1
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