IC package solutions for high performance memory

被引:0
|
作者
Solberg, V [1 ]
机构
[1] Tessera Inc, San Jose, CA USA
关键词
BGA; mu BGA (R); chip scale packaging; CSP; ball grid array; fine pitch ball grid array; FBGA; RDRAM (R); DDR SDRAM;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The market demand for chip-scale and chip-size BGA packaging for ICs is expanding rapidly. Proving to be fundamentally important to both current and future electronics, the array contact format is efficient for interconnect on the circuit board and the small component outline and lower profile (typical of these devices) is ideal for the higher component density electronic applications. The higher processing speed of today's electronics requires a very direct signal path and interconnection between controller, processor and memory. The newest generations of Rambus RDRAM memory technology, for example, have been developed to be compatible with a special new chip set from Intel, furnishing processing speeds exceeding 1GHz, almost twice the speed of the PC processors. To meet the need for packaging a silicon die for these faster processing speeds, Tessera has developed a two-sided copper, flexible polyimide film based interposer substrate employing laser ablated micro-vias. The chip-size package (unlike face-up wire bonded or direct chip attachment package structures), relies on the proven compliant muBGA(R) material system for both reliability and performance. The two metal layer interposer structure supplies a very direct die-to-ball contact interconnect and a robust ground plane within the finished package. The following will outline the process steps and design attributes that enable the fabrication of one and two metal layer flex-based interposer and the die packaging process (step-by-step).
引用
收藏
页码:128 / 135
页数:8
相关论文
共 50 条
  • [41] EMI Study of High-Speed IC Package Based on Pin Map
    Yu, Xuequan
    Bai, Yadong
    Zhou, Yan
    Bai, Wei
    Yang, Lin
    Min, Junxin
    2012 ASIA-PACIFIC INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (APEMC), 2012, : 305 - 308
  • [42] Non halogen/antimony flame retardant system for high end IC package
    Yamaguchi, M
    Shigyo, H
    Yamamoto, Y
    Sudo, S
    Ito, S
    47TH ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE, 1997 PROCEEDINGS, 1997, : 1248 - 1253
  • [43] Driver IC and COG package design
    Yen, Yee-Wen
    Lee, Chun-Yu
    IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, 2008, 31 (02): : 399 - 406
  • [44] Increasing IC Leadframe Package Reliability
    Hart, Dan
    Lee, Bruce
    Ganjei, John
    EPTC: 2008 10TH ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, VOLS 1-3, 2008, : 1209 - 1213
  • [45] Development of inspection system for the IC package
    Lee, Jung-Seob
    Kwon, Oh-Min
    Joo, Hyo-Nam
    Kim, Joon-Sik
    Rew, Keun-Ho
    Journal of Institute of Control, Robotics and Systems, 2008, 14 (05) : 453 - 461
  • [46] LED PACKAGE INCLUDES IC REGULATOR
    SIDERIS, G
    ELECTRONICS, 1973, 46 (23): : 129 - 129
  • [47] THERMALLY INDUCED IC PACKAGE CRACKING
    SUHL, D
    IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY, 1990, 13 (04): : 940 - 945
  • [49] Enabling Faster Design/Performance Decisions for 3D-IC Package Architectures
    Varadharajan, Narayanan Terizhandur
    Ozen, Metin
    Koga, Kazunari
    Mandavia, Humair
    2017 THIRTY-THIRD ANNUAL SEMICONDUCTOR THERMAL MEASUREMENT AND MANAGEMENT SYMPOSIUM (SEMI-THERM), 2017, : 63 - 69
  • [50] Investigation of Crosstalk Impact on Channel Performance from IC package and Motherboard Breakout Routing
    Hasani, Azri Husni
    Shahar, Aftanasar Md.
    Yusof, Ahmad Jalaluddin
    Kong, Jackson
    2012 10TH IEEE INTERNATIONAL CONFERENCE ON SEMICONDUCTOR ELECTRONICS (ICSE), 2012, : 583 - 587