Effects of niobium content on electrical and mechanical properties of (Na0.85K0.15)0.5Bi0.5Ti(1-x)Nb x O3 thin films

被引:9
|
作者
Li Xujun [1 ,2 ]
Pan Yong [1 ,2 ]
Gong Yueqiu [1 ,2 ]
Huang Renjie [1 ]
Liao Jiajia [1 ]
Xie Shuhong [1 ,2 ]
Zhou Yichun [1 ,2 ]
Gao Xingsen [3 ]
机构
[1] Xiangtan Univ, Fac Mat Optoelect & Phys, Xiangtan 411105, Peoples R China
[2] Xiangtan Univ, Minist Educ, Key Lab Low Dimens Mat & Applicat Technol, Xiangtan 411105, Peoples R China
[3] S China Normal Univ, Sch Phys & Telecommun Engn, Inst Adv Mat, Guangzhou 510631, Guangdong, Peoples R China
关键词
FERROELECTRIC PROPERTIES; PHASE-TRANSITION; CERAMICS; BEHAVIOR; STRESS; ENHANCEMENT; DIFFRACTION; BOUNDARY;
D O I
10.1007/s10854-014-1744-2
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
(Na0.85K0.15)(0.5)Bi0.5Ti(1-x)Nb (x) O-3 (NKBT-N100x) thin films were deposited on Pt/Ti/SiO2/Si(100) substrates by metal-organic decomposition method and annealed in oxygen atmosphere at 750 A degrees C. The effects of niobium concentration on the microstructures, ferroelectric, piezoelectric, leakage current and mechanical properties of the NKBT-N100x (x = 0, 0.01, 0.03, 0.05) thin films have been investigated in detail. The NKBT-3N thin film has the largest remnant polarization (7 mu C/cm(2)) and statistically averaged d (33eff) (140 pm/V), the smallest leakage current, elasticity modulus (102.0 Gpa), hardness (5.1 Gpa) and residual stress (297.0 Mpa). The evaluation of residual stresses of these thin films will offer useful guidelines of safe working condition for their potential application in microelectromechanical system.
引用
收藏
页码:1416 / 1422
页数:7
相关论文
共 50 条
  • [11] Effect of Sc Doping on the Structure and Electrical Properties of (Na0.85K0.15)0.5Bi0.5TiO3 Thin Films Prepared by Sol-Gel Processing
    Wu, Yunyi
    Wang, Xiaohui
    Li, Longtu
    JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 2011, 94 (08) : 2518 - 2522
  • [12] Effect of Mn Doping on Microstructure and Electrical Properties of the (Na0.85K0.15)0.5Bi0.5TiO3 Thin Films Prepared by Sol-Gel Method
    Wu, Yunyi
    Wang, Xiaohui
    Zhong, Caifu
    Li, Longtu
    JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 2011, 94 (11) : 3877 - 3882
  • [13] Microstructure and electrical properties of (1-x)K0.5Na0.5NbO3-x(Ba0.85Ca0.15)(Zr0.1Ti0.9)O3 lead-free piezoelectric ceramics
    Feng, Wei
    Huang, Yanqiu
    Du, Haiwei
    Tang, Hongping
    Qin, Haina
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2013, 24 (09) : 3262 - 3268
  • [14] Piezoelectric and pyroelectric properties of (K0.5Na0.5)1-x(Nb1-yTay)O3 ceramics
    Lang, Sidney B.
    Zhu, Wenyi
    Cross, L. E.
    FERROELECTRICS, 2006, 336 : 15 - 21
  • [15] Phase transitions and electrical/optical properties in (1-x)KNbO3-x (Ba0.5Bi0.5)(Nb0.5Zn0.5)O3 ceramics
    Zhang, Xue
    Li, Guoshuai
    Mao, Feng
    Han, Dongdong
    Jing, Chengbin
    Chen, Ye
    Yang, Pingxiong
    Chu, Junhao
    Yue, Fangyu
    CERAMICS INTERNATIONAL, 2020, 46 (11) : 18026 - 18031
  • [16] Influence of seed layer on crystal orientation and electrical properties of (Na0.85K0.15)0.5Bi0.5TiO3 thin films prepared by a sol-gel process
    Chi, Q. G.
    Yang, F. Y.
    Zhang, C. H.
    Chen, C. T.
    Zhu, H. F.
    Wang, X.
    Lei, Q. Q.
    CERAMICS INTERNATIONAL, 2013, 39 (08) : 9273 - 9276
  • [17] The domain configurations of (Na0.85K0.15)0.5Bi0.5TiO3 thin film with different bottom electrodes
    Zhu, Z.
    Zhang, X.
    Guo, J. Q.
    Zheng, X. J.
    APPLIED SURFACE SCIENCE, 2016, 367 : 59 - 63
  • [18] Enhanced energy storage properties of (1-x)Bi0.5Na0.5TiO3-xBa0.85Ca0.15Ti0.9Zr0.1O3 ceramics
    Yao, Mouteng
    Pu, Yongping
    Zhang, Lei
    Chen, Min
    MATERIALS LETTERS, 2016, 174 : 110 - 113
  • [19] The effect of annealing temperature on the piezoelectric and dielectric properties of lead-free Bi0.5(Na0.85K0.15)0.5TiO3 thin films
    Sung Sik Won
    Chang Won Ahn
    Ill Won Kim
    Journal of the Korean Physical Society, 2012, 61 : 928 - 932
  • [20] Crystallization behaviors of (Na0.85K0.15)0.5 Bi0.5TiO3 ferroelectric thin films prepared by a sol-gel route
    Chen, Chun-Tian
    Zhu, Han-Fei
    Wang, Dong-Sheng
    Gongneng Cailiao/Journal of Functional Materials, 2013, 44 (18): : 2638 - 2640