Epitaxial Ferroelectric Hf0.5Zr0.5O2 with Metallic Pyrochlore Oxide Electrodes

被引:23
|
作者
Zhang, Zimeng [1 ]
Hsu, Shang-Lin [2 ,3 ]
Stoica, Vladimir A. [4 ]
Paik, Hanjong [5 ,6 ]
Parsonnet, Eric [7 ]
Qualls, Alexander [7 ]
Wang, Jianjun [8 ]
Xie, Liang [1 ]
Kumari, Mukesh [1 ]
Das, Sujit [1 ]
Leng, Zhinan [1 ]
McBriarty, Martin [9 ]
Proksch, Roger [10 ]
Gruverman, Alexei [11 ]
Schlom, Darrell G. [5 ,6 ,12 ]
Chen, Long-Qing [8 ]
Salahuddin, Sayeef [3 ]
Martin, Lane W. [1 ,13 ]
Ramesh, Ramamoorthy [1 ,3 ,7 ]
机构
[1] Univ Calif Berkeley, Dept Mat Sci & Engn, Berkeley, CA 94720 USA
[2] Natl Ctr Electron Microscopy, Mol Foundry, Lawrence Berkeley Natl Lab, Berkeley, CA 94720 USA
[3] Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA
[4] Argonne Natl Lab, Adv Photon Source, Lemont, IL 60439 USA
[5] Cornell Univ, Platform Accelerated Realizat Anal & Discovery In, Ithaca, NY 14853 USA
[6] Cornell Univ, Dept Mat Sci & Engn, Ithaca, NY 14853 USA
[7] Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA
[8] Penn State Univ, Dept Mat Sci & Engn, University Pk, PA 16802 USA
[9] EMD Performance Mat, San Jose, CA 95134 USA
[10] Asylum Res, Goleta, CA 93117 USA
[11] Univ Nebraska, Dept Phys, Lincoln, NE 68588 USA
[12] Kavli Inst Cornell Nanoscale Sci, Ithaca, NY 14853 USA
[13] Lawrence Berkeley Natl Lab, Mat Sci Div, Berkeley, CA 94720 USA
基金
美国国家科学基金会;
关键词
epitaxial growth; ferroelectrics; hafnia; PIEZORESPONSE FORCE MICROSCOPY; BISMUTH;
D O I
10.1002/adma.202006089
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The synthesis of fully epitaxial ferroelectric Hf0.5Zr0.5O2 (HZO) thin films through the use of a conducting pyrochlore oxide electrode that acts as a structural and chemical template is reported. Such pyrochlores, exemplified by Pb2Ir2O7(PIO) and Bi2Ru2O7(BRO), exhibit metallic conductivity with room-temperature resistivity of <1 m omega cm and are closely lattice matched to yttria-stabilized zirconia substrates as well as the HZO layers grown on top of them. Evidence for epitaxy and domain formation is established with X-ray diffraction and scanning transmission electron microscopy, which show that the c-axis of the HZO film is normal to the substrate surface. The emergence of the non-polar-monoclinic phase from the polar-orthorhombic phase is observed when the HZO film thickness is >=approximate to 30 nm. Thermodynamic analyses reveal the role of epitaxial strain and surface energy in stabilizing the polar phase as well as its coexistence with the non-polar-monoclinic phase as a function of film thickness.
引用
收藏
页数:10
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