Prediction of solder bump formation in solder jet packaging process

被引:6
|
作者
Wang, Wei [1 ]
Hong, Fangjun
Qiu, Huihe
机构
[1] Beijing Polytech Univ, Dept Thermal Energy Engn, Beijing 100022, Peoples R China
[2] Hong Kong Univ Sci & Technol, Dept Mech Engn, Kowloon, Hong Kong, Peoples R China
关键词
microelectronic component packaging; solder bump;
D O I
10.1109/TCAPT.2006.880519
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Precise solder bump shape prediction is crucial for the application of the solder jet humping process to microelectronic component packaging. In. the present study, numerical simulation of both the dynamics and phase change responses during a metal droplet impingement is conducted by introducing a nonconstant interfacial heat transfer coefficient, which varies with time and position. Comparison between the numerical and experimental results for a large metal droplet demonstrates the validity of the numerical method. The results of many simulation cases are presented corresponding to typical solder jet bumping conditions. Variations in the impact velocity, initial droplet size, and droplet temperature and substrate temperature are investigated to understand their impact on the formation of solder bumps.
引用
收藏
页码:486 / 493
页数:8
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