Formation of thin β-FeSi2 template layer for the epitaxial growth of thick film on Si(111) substrate

被引:29
|
作者
Kuroda, R
Liu, ZX
Fukuzawa, Y
Suzuki, Y
Osamura, M
Wang, S
Otogawa, N
Ootsuka, T
Mise, T
Hoshino, Y
Nakayama, Y
Tanoue, H
Makita, Y
机构
[1] Natl Inst Adv Ind Sci & Technol, AIST, Tsukuba, Ibaraki 3058658, Japan
[2] Nippon Inst Technol, Minami Saitama, Saitama 3458501, Japan
[3] Syst Engineers Co Ltd, Yamato, Kanagawa 2420001, Japan
[4] Japan Sci & Technol Corp, JST, Tsukuba, Ibaraki 3058569, Japan
关键词
beta-FeSi2; template; epitaxial growth; surface; interface;
D O I
10.1016/j.tsf.2004.02.055
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
For the epitaxial growth of thick beta-FeSi2 films, we fabricated ultrathin beta-FeSi2 template layers (thinner than 20 nm) on Si (I 11) substrates with different methods. Surface morphology and crystallinity of the template layers were found to be dependent on the surface conditions of the substrate and the fabrication method. It was revealed that to form a smooth and continuous template, a hydrogen-terminated surface was better than that covered with a several-nanometer oxide layer. Using this surface, continuous (I I 0)/(10 1)-oriented epitaxial template was obtained by depositing 6-nm iron at 400 degreesC and subsequent in situ annealing at 600 degreesC in MBE chamber, namely, a reaction deposition epitaxy (RDE) method. Co-deposition of iron and silicon with atomic ratio of Fe/Si=1/2 allowed the forming of template layers at further low temperature. Co-deposited template layers exhibited better crystallinity and morphology than those prepared by RDE. By using the optimized template layer, we succeeded in growing high-quality thick beta-FeSi2 films on Si (I 11) substrates with sharp beta-FeSi2/Si interface. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:34 / 39
页数:6
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