Manufacturing cycle time reduction using balance control in the semiconductor fabrication line

被引:23
|
作者
Lee, YH [1 ]
Kim, T [1 ]
机构
[1] Yonsei Univ, Sch Comp & Ind Engn, Seoul 120749, South Korea
关键词
balance; bottleneck scheduling; utilization; cycle time reduction;
D O I
10.1080/0953728021000014954
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In semiconductor manufacturing, wafer fabrication is the most complicated and important process, and is composed of several hundred process steps and involves several hundred machines. The productivity of the manufacturing process depends mainly on controlling the balance of WIP (work-in-progress) flow to achieve maximum throughput under short manufacturing cycle times. This paper discusses how to determine the proper WIP level for operations, against which balance status can be measured. Balance measurement can be applied in mathematical modelling for bottleneck scheduling and operations management of the fabrication line. Performances are evaluated through computational experiments to show that balance driven management leads to 15-33% more production in 21% shorter manufacturing cycle time than production driven management.
引用
收藏
页码:529 / 540
页数:12
相关论文
共 50 条
  • [21] Manufacturing intelligence to forecast and reduce semiconductor cycle time
    Chen-Fu Chien
    Chia-Yu Hsu
    Chih-Wei Hsiao
    [J]. Journal of Intelligent Manufacturing, 2012, 23 : 2281 - 2294
  • [22] Production Control in Semiconductor manufacturing with Time Constraints
    Sadeghi, Rezvan
    Dauzere-Peres, Stephane
    Yugma, Claude
    Lepelletier, Guillaume
    [J]. 2015 26TH ANNUAL SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE (ASMC), 2015, : 29 - 33
  • [23] Manufacturing Enhancement through Reduction of Cycle Time using Different Lean Techniques
    Rekha, R. Suganthini
    Periyasamy, P.
    Nallusamy, S.
    [J]. INTERNATIONAL CONFERENCE ON MATERIALS, ALLOYS AND EXPERIMENTAL MECHANICS (ICMAEM-2017), 2017, 225
  • [24] Cycle time prediction and control based on production line status and manufacturing data mining
    Chien, CF
    Hsiao, CW
    Meng, C
    Hong, KT
    Wang, ST
    [J]. ISSM 2005: IEEE International Symposium on Semiconductor Manufacturing, Conference Proceedings, 2005, : 327 - 330
  • [25] Technique to Improve Visibility for Cycle Time Improvement in Semiconductor Manufacturing
    Ab Rahim, Syahril Ridzuan
    Ahmad, Ibrahim
    Chik, Mohd Azizi
    [J]. 2012 10TH IEEE INTERNATIONAL CONFERENCE ON SEMICONDUCTOR ELECTRONICS (ICSE), 2012, : 627 - 630
  • [26] A METHOD FOR CYCLE TIME ESTIMATION OF SEMICONDUCTOR MANUFACTURING TOOLSETS WITH CORRELATIONS
    Akhavan-Tabatabaei, Raba
    Ding, Shengwei
    Shanthikumar, J. George
    [J]. PROCEEDINGS OF THE 2009 WINTER SIMULATION CONFERENCE (WSC 2009 ), VOL 1-4, 2009, : 1686 - +
  • [27] Cycle-time improvements for photolithography process in semiconductor manufacturing
    Akçali, E
    Nemoto, K
    Uzsoy, R
    [J]. IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 2001, 14 (01) : 48 - 56
  • [28] Optimization of cycle time assembly line for mass manufacturing
    Kumar, Pankaj
    Prasad, Shashi Bhushan
    Patel, Dharmendra
    Kumar, Kaushal
    Dixit, Saurav
    Nikolaevna, Shchepkina Natalia
    [J]. INTERNATIONAL JOURNAL OF INTERACTIVE DESIGN AND MANUFACTURING - IJIDEM, 2024, 18 (05): : 2831 - 2842
  • [29] ON THE RELATIONSHIP BETWEEN YIELD AND CYCLE TIME IN SEMICONDUCTOR WAFER FABRICATION
    WEIN, LM
    [J]. IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 1992, 5 (02) : 156 - 158
  • [30] Sustainable Manufacturing through Systematic Reduction in Cycle Time
    Goyal, Ankur
    Vaish, Dinesh Chandra
    Agrawal, Rajat
    Choudhary, Sonal
    Nayak, Rakesh
    [J]. SUSTAINABILITY, 2022, 14 (24)