High quality, large surface area, homoepitaxial MPACVD diamond growth

被引:101
|
作者
Silva, F. [1 ]
Achard, J. [1 ]
Brinza, O. [1 ]
Bonnin, X. [1 ]
Hassouni, K. [1 ]
Anthonis, A. [2 ]
De Corte, K. [2 ]
Barjon, J. [3 ]
机构
[1] Univ Paris 13, LIMHP, CNRS, Inst Galilee, F-93430 Villetaneuse, France
[2] HRD Res, B-2500 Lier, Belgium
[3] Univ Versailles St Quentin En Yvelines, CNRS, Grp Etud Mat Condensee, F-92195 Meudon, France
关键词
Homoepitaxial diamond; Crystal growth; Plasma modelling; Microwave plasma engineering; CHEMICAL-VAPOR-DEPOSITION; CRYSTAL CVD DIAMOND; POWER DENSITY REGIME; SYNTHETIC DIAMOND; THIN-FILMS; PLASMA; DEPENDENCE; MOBILITY; REACTOR; MODEL;
D O I
10.1016/j.diamond.2009.01.038
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The use of CVD diamond in electronics has very stringent requirements. For a CVD diamond industry to become viable it is mandatory to obtain very large growth rates (> 5 mu m/h), all the while maintaining extremely high purity, a crystalline defect density as low as possible, and large usable surface areas. At the same time, one must keep the stress level within the growing crystal below acceptable limits to avoid crack formation and preserve the crystal structural integrity. These imperatives imply to work to improve both the plasma deposition process and the CVD diamond crystal growth. In this paper, we propose a three-pronged approach: (i) We use detailed plasma models to establish the influence of process parameters (in particular deposition pressure) on plasma chemistry in order to optimize film growth rate and diamond quality; (ii) We emphasize the need for careful substrate pre-treatment and selection (including choosing a single-sector face) to minimize defects in the growing films; (iii) We employ a 3D geometrical model to predict the crystal shape under given growth conditions, and exploit this knowledge to devise a growth strategy maximizing the usable film surface area while minimizing stresses inside the films. (C) 2009 Elsevier B.V. All rights reserved.
引用
收藏
页码:683 / 697
页数:15
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