EMI reduction by chip-package-board co-design

被引:0
|
作者
Kiyoshige, Sho [1 ]
Ichimura, Wataru [1 ]
Terasaki, Masahiro [1 ]
Kobayashi, Ryota [1 ]
Sudo, Toshio [1 ]
机构
[1] Shibaura Inst Technol, Koto Ku, Tokyo 108, Japan
关键词
CIRCUITS;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Electromagnetic radiation is always headachy issue in developing various electronic systems. Because electro-magnetic radiation and interference (EMI) is very sensitive to signal routing and physical layout of power distribution network (PDN) in package and board as well as chip design. Therefore, chip-package co-design is becoming important by taking into account the total PDN impedance seen from the chip. Especially, parallel resonance peaks in the PDN due to the chip-package interaction induces the unwanted power supply fluctuation, and results in serious EMI troubles. In this paper, three test chips were designed with different on-chip PDN properties. These three chips were intended to have typical characteristics; oscillatory region and damped condition. Then, the effects of the total PDN impedance on EMI have been studied. In particular, anti-resonance peak was properly suppressed by establishing critical damping condition in chip-package-board co-design. EMI has been proved to be dramatically reduced by proper combination of on-chip capacitance, on-chip resistance and package inductance.
引用
收藏
页码:946 / 951
页数:6
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