Substrate-Dependent Growth Mode Control of MoS2 Monolayers: Implications for Hydrogen Evolution and Field-Effect Transistors

被引:4
|
作者
Choi, Min-Yeong [1 ]
Choi, Chang-Won [2 ]
Yang, Seong-Jun [1 ]
Lee, Hojeong [2 ]
Choi, Shinyoung [1 ]
Park, Jun-Ho [1 ]
Heo, Jong [2 ]
Choi, Si-Young [2 ]
Kim, Cheol-Joo [1 ]
机构
[1] Pohang Univ Sci & Technol, Dept Chem Engn, Pohang 37673, South Korea
[2] Pohang Univ Sci & Technol, Dept Mat Sci & Engn, Pohang 37673, South Korea
基金
新加坡国家研究基金会;
关键词
metal-organic chemical vapor deposition; MoS2; catalyst; vapor-liquid-solid growth; vapor-solid-solid growth; domain structures; glass substrates; CHEMICAL-VAPOR-DEPOSITION; PHASE GROWTH;
D O I
10.1021/acsanm.2c00369
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The control of domain sizes provides a powerful means to engineer the characteristics of monolayer (ML) MoS2 films for specific applications including catalysts for hydrogen evolution and thin-film transistors. Here, we report an efficient way to control domain structures of MoS2 by substrate-dependent growth mode control. Deterministic control of growth modes, associated with catalytic intermediates, is introduced by utilizing different growth substrates in metal-organic chemical vapor deposition (MOCVD) of ML MoS2. Na-Mo-O eutectic alloys formed by a soda lime (SL) substrate dominate the growth based on a vapor-liquid-solid (VLS) process, resulting in large-crystalline domains of MoS2 with a reduced density of liquid nuclei. On the other hand, MoO3-x seeds formed from an alkali aluminosilicate (AA) substrate accelerate nucleation via a vapor-solid-solid (VSS) process for nanocrystalline domains. ML MoS2 of nanocrystalline domains resulted in efficient hydrogen evolution reactions (HERs), while large-domain films showed better electron conductivity.
引用
收藏
页码:4336 / 4342
页数:7
相关论文
共 50 条
  • [1] Role of Surface Processes in Growth of Monolayer MoS2: Implications for Field-Effect Transistors
    Kumar, V. Kranthi
    Rathkanthiwar, Shashwat
    Rao, Ankit
    Ghosh, Priyadarshini
    Dhar, Sukanya
    Chandrasekar, Hareesh
    Choudhury, Tanushree
    Shivashankar, S. A.
    Raghavan, Srinivasan
    [J]. ACS APPLIED NANO MATERIALS, 2021, 4 (07) : 6734 - 6744
  • [2] High mobility ambipolar MoS2 field-effect transistors: Substrate and dielectric effects
    Bao, Wenzhong
    Cai, Xinghan
    Kim, Dohun
    Sridhara, Karthik
    Fuhrer, Michael S.
    [J]. APPLIED PHYSICS LETTERS, 2013, 102 (04)
  • [3] Temperature-Dependent Opacity of the Gate Field Inside MoS2 Field-Effect Transistors
    Ji, Hyunjin
    Ghimire, Mohan Kumar
    Lee, Gwanmu
    Yi, Hojoon
    Sakong, Wonkil
    Gul, Hamza Zad
    Yun, Yoojoo
    Jiang, Jinbao
    Kim, Joonggyu
    Joo, Min-Kyu
    Suh, Dongseok
    Lim, Seong Chu
    [J]. ACS APPLIED MATERIALS & INTERFACES, 2019, 11 (32) : 29022 - 29028
  • [4] Contact-dependent performance variability of monolayer MoS2 field-effect transistors
    Han, Gyuchull
    Yoon, Youngki
    [J]. APPLIED PHYSICS LETTERS, 2014, 105 (21)
  • [5] Thickness-dependent Schottky barrier height of MoS2 field-effect transistors
    Kwon, Junyoung
    Lee, Jong-Young
    Yu, Young-Jun
    Lee, Chul-Ho
    Cui, Xu
    Honed, James
    Lee, Gwan-Hyoung
    [J]. NANOSCALE, 2017, 9 (18) : 6151 - 6157
  • [6] Annealed Ag contacts to MoS2 field-effect transistors
    Abraham, Michael
    Mohney, Suzanne E.
    [J]. JOURNAL OF APPLIED PHYSICS, 2017, 122 (11)
  • [7] MoS2 Field-Effect Transistors With Graphene/Metal Heterocontacts
    Du, Yuchen
    Yang, Lingming
    Zhang, Jingyun
    Liu, Han
    Majumdar, Kausik
    Kirsch, Paul D.
    Ye, Peide D.
    [J]. IEEE ELECTRON DEVICE LETTERS, 2014, 35 (05) : 599 - 601
  • [8] On Monolayer MoS2 Field-Effect Transistors at the Scaling Limit
    Liu, Leitao
    Lu, Yang
    Guo, Jing
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2013, 60 (12) : 4133 - 4139
  • [9] Process implications on the stability and reliability of 300 mm FAB MoS2 field-effect transistors
    Yu. Yu. Illarionov
    A. Karl
    Q. Smets
    B. Kaczer
    T. Knobloch
    L. Panarella
    T. Schram
    S. Brems
    D. Cott
    I. Asselberghs
    T. Grasser
    [J]. npj 2D Materials and Applications, 8
  • [10] Process implications on the stability and reliability of 300 mm FAB MoS2 field-effect transistors
    Illarionov, Yu. Yu.
    Karl, A.
    Smets, Q.
    Kaczer, B.
    Knobloch, T.
    Panarella, L.
    Schram, T.
    Brems, S.
    Cott, D.
    Asselberghs, I.
    Grasser, T.
    [J]. NPJ 2D MATERIALS AND APPLICATIONS, 2024, 8 (01)