Measuring the wavelength-dependent divergence of transmission through sub-wavelength hole-arrays by spectral imaging

被引：14
|
作者：
Docter, M. W.
Young, I. T.
Piciu, O. M.
Bossche, A.
Alkemade, P. F. A.
van den Berg, P. M.
Garini, Y.
机构：
[1] Delft Univ Technol, NL-2628 CJ Delft, Netherlands
[2] Delft Univ Technol, Dept Microelect, DIMES, NL-2628 CD Delft, Netherlands
[3] Bar Ilan Univ, Dept Phys, IL-52900 Ramat Gan, Israel
来源：
OPTICS EXPRESS | 2006年 / 14卷 / 20期
基金：
英国医学研究理事会;
关键词：
D O I：
10.1364/OE.14.009477
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We present a study on the far-field patterns of light transmitted through sub-wavelength metallic hole-arrays. Spectral imaging measurements are used here on hole arrays for the first time. It provides both spatial and spectral information of the transmission in far-field. The visibility of the images, measured in two illumination modes: Kohler and collimated, is calculated for different planes in and out of focus. The transmission under collimated illumination reveals that 75% of the beam if non-divergent. The results are in agreement with the low divergence measured by Lezec
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页码：9477 / 9482
页数：6
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