Sub-wavelength THz imaging through optical rectification

被引:0
|
作者
Soylu, G. [1 ]
Herault, E. [1 ]
Laurell, F. [2 ]
Boulanger, B. [3 ]
Coutaz, J-L [1 ]
机构
[1] Univ Grenoble Alpes, Univ Savoie Mt Blanc, UMR CNRS 5130, Grenoble INP,IMEP LAHC, Bat Chablais, F-73376 Le Bourget Du Lac, France
[2] Royal Inst Technol, KTH, Dept Appl Phys, Roslagstullsbacken 21, S-10691 Stockholm, Sweden
[3] Univ Grenoble Alpes, Inst NEEL, F-38042 Grenoble, France
关键词
D O I
10.1109/irmmw-thz.2019.8873798
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Sub-wavelength THz imaging has previously been demonstrated by the optical rectification method, i.e. generating THz waves in the sample [1]. We have rendered the initial experimental setup more practical by using a simple fs laser oscillator and an efficient photo-conducting detector. We thus recorded images, at different THz frequencies with a 41-mu m lateral resolution, of a sample made of ZnTe grains, and generated THz peak magnitudes with a 33 mu m and 12 mu m lateral resolution of a periodically poled KTP crystal.
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