Temperature dependence of electrical resistivity of Co/Cu multilayers at static magnetic field

Temperature dependence of the electrical resistivity has been measured below 50 K for the sputtered magnetic multilayers [Co(1.02 nm)/Cu(t(Cu) nm)](25) with different Cu thickness at various magnetic fields. It is found that the electrical resistivities of ferromagnetic (FM) multilayer (t(Cu) = 0.76 nm) and the antiferromagnetic (AFM) one (t(Cu) = 1.05 nm) show temperature dependence of T-3/2 and T-2, respectively. The slope, A', of each power law has a maximum near H-s. The results imply that the magnetic fluctuation is a maximum near H-s showing quantum phase transition. (C) 2003 Elsevier B.V. All rights reserved.