Temperature dependence of electrical resistivity of Co/Cu multilayers at static magnetic field

被引：0

作者：

Suenaga, K

Oomi, G ^{[1
]}

Uwatoko, Y

Sakai, T

Saito, K

Takanashi, K

Fujimori, H

机构：

[1] Kyushu Univ, Dept Phys, Fukuoka 8108560, Japan

[2] Univ Tokyo, Inst Solid State Phys, Kashiwa, Chiba 2778581, Japan

[3] Ariake Natl Coll Technol, Dept Gen Educ, Omuta, Fukuoka 8368585, Japan

[4] Tohoku Univ, Inst Mat Res, Sendai, Miyagi 9808577, Japan

来源：

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 2004年 / 272卷

关键词：

multilayers and superlattice; resistivity; temperature dependence;

D O I：

10.1016/j.jmmm.2003.12.069

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Temperature dependence of the electrical resistivity has been measured below 50 K for the sputtered magnetic multilayers [Co(1.02 nm)/Cu(t(Cu) nm)](25) with different Cu thickness at various magnetic fields. It is found that the electrical resistivities of ferromagnetic (FM) multilayer (t(Cu) = 0.76 nm) and the antiferromagnetic (AFM) one (t(Cu) = 1.05 nm) show temperature dependence of T-3/2 and T-2, respectively. The slope, A', of each power law has a maximum near H-s. The results imply that the magnetic fluctuation is a maximum near H-s showing quantum phase transition. (C) 2003 Elsevier B.V. All rights reserved.

引用

页码：1231 / 1232

页数：2

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