A novel parametric test method for communication systems mixed-signal circuits using discrete wavelet transform

被引：0

作者：

Akujuobi, CM ^{[1
]}

Hu, L ^{[1
]}

机构：

[1] Prairie View A&M Univ, CECSTR, Prairie View, TX 77446 USA

来源：

PROCEEDINGS OF THE IASTED INTERNATIONAL CONFERENCE ON COMMUNICATIONS, INTERNET, AND INFORMATION TECHNOLOGY | 2002年

关键词：

mixed-signal systems; discrete wavelet transforms; analog-to-digital converter; testing; effective number of bits;

D O I：

暂无

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

In this paper, a novel parametric test method for communication systems mixed-signal circuits is presented. A discrete wavelet transform is applied to the response signal of the device under test (DUT). We will show that in comparison to Fourier transform methods, particular properties of this transformation are advantageous for communication systems mixed-signal test and especially built-in self test. Our test methodology is demonstrated on an Analog-to-Digital Converter (ADC). The new method can be easily implemented.

引用

页码：132 / 135

页数：4

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