Contactless probing of high-frequency electrical signals with scanning probe microscopy

被引：0

作者：

Mertin, W ^{[1
]}

机构：

[1] Gerhard Mercator Univ Duisburg, Fac Engn Sci, Inst Mat Elect Engn, D-47048 Duisburg, Germany

来源：

2002 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-3 | 2002年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Circuit internal test techniques working in a contactless manner are necessary for failure analysis and design verification of high-speed and high-frequency circuits. A relative new technique is the Scanning Probe Voltage Measurement technique, a technique which is based on scanning probe microscopy. This paper gives an overview of the state-of-the-art of this technique and demonstrates some practical examples.

引用

页码：1493 / 1496

页数：4

共 50 条

[41] HIGH-FREQUENCY PROBING OF POLY AND DIFFUSION LINES
BELL, O
EISENSTADT, WR
SOLID STATE TECHNOLOGY, 1991, 34 (08) : 71 - 75
[42] HIGH-FREQUENCY WAFER-PROBING TECHNIQUES
RABJOHN, G
WOLCZANSKI, J
SURRIDGE, R
CANADIAN JOURNAL OF PHYSICS, 1987, 65 (08) : 850 - 855
[43] SUBSURFACE PROBING BY MEASUREMENT OF HIGH-FREQUENCY WAVETILT
LYTLE, RJ
LAGER, DL
LAINE, EF
GEOPHYSICS, 1976, 41 (02) : 363 - 363
[44] Scanning probe microscopy imaging of frequency dependent electrical transport through carbon nanotube networks in polymers
Kalinin, SV
Jesse, S
Shin, J
Baddorf, AP
Guillorn, MA
Geohegan, DB
NANOTECHNOLOGY, 2004, 15 (08) : 907 - 912
[45] Electrical Scanning Probe Microscopy on Active Organic Electronic Devices
Pingree, Liam S. C.
Reid, Obadiah G.
Ginger, David S.
ADVANCED MATERIALS, 2009, 21 (01) : 19 - 28
[46] Some examples of local electrical characterization by scanning probe microscopy
Ryu, Kyunghee
Kim, Sejin
Choi, Yoojung
Shin, Hyunjung
Kim, Chan-Hyung
Bin Yun, Jung
Lee, Bongki
ELECTRONIC MATERIALS LETTERS, 2007, 3 (03) : 127 - 135
[47] Electrical Characteristics of Organic Molecular Wires by Scanning Probe Microscopy
Lee, N. J.
Kim, S. B.
Koo, S. H.
Choi, Y. J.
Kim, J. W.
Kim, Y. S.
Kang, C. J.
2008 2ND IEEE INTERNATIONAL NANOELECTRONICS CONFERENCE, VOLS 1-3, 2008, : 443 - +
[48] Local electrical characterization of SOI wafers by scanning probe microscopy
Ishizuka, Y
Uchihashi, T
Yoshida, H
Kishino, S
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 2002, 91 : 156 - 159
[49] Scanning Probe Microscopy for Nanoscale Characterization of Electrical and Magnetic Properties
Maryon, Olivia
2019 IEEE WORKSHOP ON MICROELECTRONICS AND ELECTRON DEVICES (WMED), 2019, : 41 - 41
[50] Advanced Frequency Analysis of Signals with High-Frequency Resolution
Flegner, Patrik
Kacur, Jan
Durdan, Milan
Laciak, Marek
Francakova, Rebecca
COMPUTATION, 2024, 12 (11)

← 1 2 3 4 5 →