Argon gas, by near-ambient pressure XPS

Near-ambient pressure-x-ray photoelectron spectroscopy (NAP-XPS) is a less traditional form of XPS that allows samples to be analyzed at relatively high pressures, i.e., greater than 2500Pa. With NAP-XPS, XPS can analyze moderately volatile liquids, biological samples, porous materials, and/or polymeric materials that outgas significantly. In this submission, we show survey, 2s, 2p, 3s, 3p, and the Auger LMM NAP-XPS spectra from argon gas, a material that could not be analyzed at moderate pressures by conventional methods. A small N 1s signal from residual nitrogen gas in the chamber is also present in the survey spectrum.