Area-Efficient Fault Tolerant Design for Finite State Machines

被引：0

作者：

Choi, Soyeon ^{[1
]}

Park, Jiwoon ^{[1
]}

Yoo, Hoyoung ^{[1
]}

机构：

[1] Chungnam Natl Univ, Dept Elect Engn, Daejeon, South Korea

来源：

2020 INTERNATIONAL CONFERENCE ON ELECTRONICS, INFORMATION, AND COMMUNICATION (ICEIC) | 2020年

基金：

新加坡国家研究基金会;

关键词：

digital circuit control; FSM; fault-tolerant; time-redundancy; selective fault-tolerant;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The finite state machine (FSM) controls the operation of the entire system. Therefore, if the errors occur in the FSM, it causes serious problem of the system. The fault tolerant state machine is proposed to deal with the errors in the FSM. In this paper, we propose a selective fault-tolerant finite state machine that increases fault-tolerance by applying the faulttolerant circuit selectively according to the importance of state. The proposed SFT-FSM is 39% smaller when the redundancy factor N is 9, compared to the FSM with NMR technique.

引用

页数：2

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