Measuring Dynamic Phenomena at the Sub-micron Scale

被引：1
|
作者：
Soria, Julio [1 ]
Amili, Omid [1 ]
Atkinson, Callum [1 ]
机构：
[1] Monash Univ, Dept Mech & Aerosp Engn, LTRAC, Melbourne, Vic 3800, Australia
来源：
2008 INTERNATIONAL CONFERENCE ON NANOSCIENCE AND NANOTECHNOLOGY | 2008年
关键词：
sub-micron phenomena; holography; PIV; dynamics;
D O I：
10.1109/ICONN.2008.4639263
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
measuring the spatio-temporal evolution of dynamic phenomena at sub-micron level is non-trivial due to the diffraction limit of optical systems. This paper describes a technique which allows imaging of sub-micron features of fluid-based phenomena, specifically the determination of their velocity and trajectory.
引用
收藏
页码：129 / 132
页数：4
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