An Anomalous Gain Mechanism in GaN Schottky Barrier Ultraviolet Photodetectors

被引:1
|
作者
Zhao De-Gang [1 ]
Jiang De-Sheng [1 ]
Liu Zong-Shun [1 ]
Zhu Jian-Jun [1 ]
Wang Hui [1 ]
Zhang Shu-Ming [1 ]
Yang Hui [1 ,2 ]
机构
[1] Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China
[2] Chinese Acad Sci, Suzhou Inst Nanotech & Nanobion, Suzhou 215125, Peoples R China
基金
中国国家自然科学基金; 国家高技术研究发展计划(863计划);
关键词
SINGLE-CRYSTAL GAN; HETEROJUNCTION; DETECTORS; PHOTODIODES; LAYER;
D O I
暂无
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The gain mechanism in GaN Schottky barrier ultraviolet photodetectors is investigated by focused light beam. When the incident light illuminates the central region of the Schottky contact electrode, the responsivity changes very little with the increase of reverse bias voltage. However, when the incident light illuminates the edge region of the electrode, the responsivity increases remarkably with the increase of reverse bias voltage, and the corresponding quantum efficiency could be even higher than 100%. It is proposed that the surface states near the edge of the electrode may lead to a reduction of effective Schottky barrier height and an enhancement of electron injection, resulting in the anomalous gain.
引用
收藏
页数:4
相关论文
共 50 条
  • [21] GaN Schottky Barrier Photodetectors Prepared on Patterned Sapphire Substrate
    Chang, S. J.
    Wang, S. M.
    Chen, T. P.
    Young, S. J.
    Lin, Y. C.
    Wu, S. L.
    Huang, B. R.
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2010, 157 (06) : J212 - J215
  • [22] GaN Schottky barrier photodetectors with a low-temperature GaN cap layer
    Lee, ML
    Sheu, JK
    Lai, WC
    Chang, SJ
    Su, YK
    Chen, MG
    Kao, CJ
    Chi, GC
    Tsai, JM
    APPLIED PHYSICS LETTERS, 2003, 82 (17) : 2913 - 2915
  • [23] Schottky Barrier Near-Ultraviolet Photodetectors Based on ZnSe
    Bouhdada, A.
    Hanzaz, M.
    Vigue, F.
    Faurie, J. P.
    JOURNAL OF ACTIVE AND PASSIVE ELECTRONIC DEVICES, 2005, 1 (01): : 79 - 89
  • [24] Influence of dislocation density and carbon impurities in i-GaN layer on the performance of Schottky barrier ultraviolet photodetectors
    Yi Linkai
    Qi Haoran
    Huang Jialin
    Zhou Mei
    Zhao Degang
    Jiang Desheng
    Yang Jing
    Liu Wei
    Liang Feng
    MATERIALS RESEARCH EXPRESS, 2018, 5 (04):
  • [25] Characterization of GaN Schottky barrier photodetectors with a low-temperature GaN cap layer
    Lee, ML
    Sheu, JK
    Lai, WC
    Su, YK
    Chang, SJ
    Kao, CJ
    Tun, CJ
    Chen, MG
    Chang, WH
    Chi, GC
    Tsai, JM
    JOURNAL OF APPLIED PHYSICS, 2003, 94 (03) : 1753 - 1757
  • [26] AlGaN-GaN Schottky-barrier photodetectors with LT GaN cap layers
    Ko, TK
    Chang, SJ
    Su, YK
    Lee, ML
    Chang, CS
    Lin, YC
    Shei, SC
    Sheu, JK
    Chen, WS
    Shen, CF
    JOURNAL OF CRYSTAL GROWTH, 2005, 283 (1-2) : 68 - 71
  • [27] Hybrid AIN-SiC deep ultraviolet schottky barrier photodetectors
    Dahal, R.
    Al Tahtamouni, T. M.
    Fan, Z. Y.
    Lin, J. Y.
    Jiang, H. X.
    APPLIED PHYSICS LETTERS, 2007, 90 (26)
  • [28] ZnO Schottky ultraviolet photodetectors
    Liang, S
    Sheng, H
    Liu, Y
    Huo, Z
    Lu, Y
    Shen, H
    JOURNAL OF CRYSTAL GROWTH, 2001, 225 (2-4) : 110 - 113
  • [29] GaN Schottky ultraviolet photodetectors using the metal-semiconductor-metal structure
    Toriz-Garcia, JJ
    Parbrook, PJ
    Wood, DA
    David, JPR
    EDMO 2001: INTERNATIONAL SYMPOSIUM ON ELECTRON DEVICES FOR MICROWAVE AND OPTOELECTRONIC APPLICATIONS, 2001, : 131 - 136
  • [30] GaN Schottky Barrier Photodetectors with a Semi-Insulating AlInN Cap Layer
    Chang, S. J.
    Weng, W. Y.
    Lai, W. C.
    Hsueh, T. J.
    Shei, S. C.
    Zeng, X. F.
    Wu, S. L.
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2010, 157 (04) : J120 - J124