Traceable Metrology for Single Photon Detection Characterization

被引：0
|
作者：
Jing, Zhang [1 ]
Mingze, Ian Foo [1 ]
机构：
[1] Agcy Sci Technol & Res, Natl Metrol Ctr, Singapore, Singapore
来源：
2017 OPTO-ELECTRONICS AND COMMUNICATIONS CONFERENCE (OECC) AND PHOTONICS GLOBAL CONFERENCE (PGC) | 2017年
关键词：
single photon counting; detection probability; linearity; uncertainty;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We present a single photon counting measurement setup and characterize a Single Photon Counting Module (SPCM) by determining the measurement result for photon detection probability and linearity. The measurements were made by using calibrated photodetectors and calibrated attenuators, and are traceable to the cryogenic radiometer-based primary standard. A detailed measurement uncertainty analysis will be provided.
引用
收藏
页数：4
相关论文
共 50 条
  • [1] Single-photon metrology
    Seiji Armstrong
    [J]. Nature Photonics, 2012, 6 (10) : 636 - 636
  • [2] Generating entangled spin states for quantum metrology by single-photon detection
    McConnell, Robert
    Zhang, Hao
    Cuk, Senka
    Hu, Jiazhong
    Schleier-Smith, Monika H.
    Vuletic, Vladan
    [J]. PHYSICAL REVIEW A, 2013, 88 (06):
  • [3] Single event photon statistics characterization of a single photon source in an imperfect detection system
    Huang, Tao
    Wang, Xiaobo
    Shao, Junhu
    Guo, Xujin
    Xiao, Liantuan
    Ha, Suotang
    [J]. JOURNAL OF LUMINESCENCE, 2007, 124 (02) : 286 - 290
  • [4] Detection Efficiency Measurement of Silicon Single-photon Avalanche Detector Traceable Using Standard Detector
    Liu Chang-ming
    Shi Xue-shun
    Zhang Peng-ju
    Zhuang Xin-gang
    Liu Hong-bo
    [J]. ACTA PHOTONICA SINICA, 2019, 48 (12)
  • [5] Traceable metrology for large involute gears
    Wiemann, Ann-Kathrin
    Stein, Martin
    Kniel, Karin
    [J]. PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY, 2019, 55 : 330 - 338
  • [6] Towards traceable transient pressure metrology
    Hanson, Edward
    Olson, Douglas A.
    Liu, Haijun
    Ahmed, Zeeshan
    Douglass, Kevin O.
    [J]. METROLOGIA, 2018, 55 (02) : 275 - 283
  • [7] Traceable terahertz power metrology at NIST
    White, Malcolm G.
    Dowell, Marla L.
    Lehman, John H.
    [J]. 2014 39TH INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER, AND TERAHERTZ WAVES (IRMMW-THZ), 2014,
  • [8] Single-photon detector characterization using correlated photons: the march from feasibility to metrology
    Ware, M
    Migdall, A
    [J]. JOURNAL OF MODERN OPTICS, 2004, 51 (9-10) : 1549 - 1557
  • [9] Detection efficiency calibration of single-photon silicon avalanche photodiodes traceable using double attenuator technique
    Lopez, Marco
    Hofer, Helmuth
    Kueck, Stefan
    [J]. JOURNAL OF MODERN OPTICS, 2015, 62 (20) : 1732 - 1738
  • [10] Traceable characterisation of fibre-coupled single-photon detectors
    Arabskyj, Luke
    Dolan, Philip R.
    Parke, Adam L.
    Santana, Ted S.
    Hall, Simon R. G.
    Porrovecchio, Geiland
    Smid, Marek
    Lucamarini, Marco
    Chunnilall, Christopher J.
    [J]. METROLOGIA, 2024, 61 (05)
12345