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- [4] Traceable terahertz power metrology at NIST 2014 39TH INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER, AND TERAHERTZ WAVES (IRMMW-THZ), 2014,
- [5] Traceable Metrology for Single Photon Detection Characterization 2017 OPTO-ELECTRONICS AND COMMUNICATIONS CONFERENCE (OECC) AND PHOTONICS GLOBAL CONFERENCE (PGC), 2017,
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- [10] Traceable atomic force microscope dimensional metrology at NIST METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XX, PTS 1 AND 2, 2006, 6152