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- [21] Development of a traceable profilometer for high-aspect-ratio microstructures metrologySURFACE TOPOGRAPHY-METROLOGY AND PROPERTIES, 2014, 2 (02):Xu, Min论文数: 0 引用数: 0 h-index: 0机构: PTB, Bundesallee 100, D-38116 Braunschweig, Germany PTB, Bundesallee 100, D-38116 Braunschweig, GermanyKirchhoff, Juergen论文数: 0 引用数: 0 h-index: 0机构: PTB, Bundesallee 100, D-38116 Braunschweig, Germany PTB, Bundesallee 100, D-38116 Braunschweig, GermanyBrand, Uwe论文数: 0 引用数: 0 h-index: 0机构: PTB, Bundesallee 100, D-38116 Braunschweig, Germany PTB, Bundesallee 100, D-38116 Braunschweig, Germany
- [22] Traceable size determination of nanoparticles, a comparison among European metrology institutesMEASUREMENT SCIENCE AND TECHNOLOGY, 2012, 23 (12)Meli, Felix论文数: 0 引用数: 0 h-index: 0机构: Swiss Fed Off Metrol METAS, CH-3084 Wabern, Switzerland Swiss Fed Off Metrol METAS, CH-3084 Wabern, SwitzerlandKlein, Tobias论文数: 0 引用数: 0 h-index: 0机构: PTB, D-38116 Braunschweig, Germany Swiss Fed Off Metrol METAS, CH-3084 Wabern, SwitzerlandBuhr, Egbert论文数: 0 引用数: 0 h-index: 0机构: PTB, D-38116 Braunschweig, Germany Swiss Fed Off Metrol METAS, CH-3084 Wabern, SwitzerlandFrase, Carl Georg论文数: 0 引用数: 0 h-index: 0机构: PTB, D-38116 Braunschweig, Germany Swiss Fed Off Metrol METAS, CH-3084 Wabern, SwitzerlandGleber, Gudrun论文数: 0 引用数: 0 h-index: 0机构: PTB, D-10587 Berlin, Germany Swiss Fed Off Metrol METAS, CH-3084 Wabern, SwitzerlandKrumrey, Michael论文数: 0 引用数: 0 h-index: 0机构: PTB, D-10587 Berlin, Germany Swiss Fed Off Metrol METAS, CH-3084 Wabern, SwitzerlandDuta, Alexandru论文数: 0 引用数: 0 h-index: 0机构: Natl Inst Metrol INM, Bucharest 042122, Romania Swiss Fed Off Metrol METAS, CH-3084 Wabern, SwitzerlandDuta, Steluta论文数: 0 引用数: 0 h-index: 0机构: Natl Inst Metrol INM, Bucharest 042122, Romania Swiss Fed Off Metrol METAS, CH-3084 Wabern, SwitzerlandKorpelainen, Virpi论文数: 0 引用数: 0 h-index: 0机构: Ctr Metrol & Accreditat MIKES, FI-02151 Espoo, Finland Swiss Fed Off Metrol METAS, CH-3084 Wabern, SwitzerlandBellotti, Roberto论文数: 0 引用数: 0 h-index: 0机构: Ist Nazl Ric Metrol INRIM, I-10135 Turin, Italy Swiss Fed Off Metrol METAS, CH-3084 Wabern, SwitzerlandPicotto, Gian Bartolo论文数: 0 引用数: 0 h-index: 0机构: Ist Nazl Ric Metrol INRIM, I-10135 Turin, Italy Swiss Fed Off Metrol METAS, CH-3084 Wabern, SwitzerlandBoyd, Robert D.论文数: 0 引用数: 0 h-index: 0机构: Natl Phys Lab, Teddington TW11 0LW, Middx, England Swiss Fed Off Metrol METAS, CH-3084 Wabern, SwitzerlandCuenat, Alexandre论文数: 0 引用数: 0 h-index: 0机构: Natl Phys Lab, Teddington TW11 0LW, Middx, England Swiss Fed Off Metrol METAS, CH-3084 Wabern, Switzerland
- [23] Photomask applications of traceable atomic force microscope dimensional metrology at NISTPHOTOMASK TECHNOLOGY 2007, PTS 1-3, 2007, 6730Dixson, Ronald论文数: 0 引用数: 0 h-index: 0机构: Natl Inst Stand & Technol, Gaithersburg, MD 20899 USA Natl Inst Stand & Technol, Gaithersburg, MD 20899 USAOrji, Ndubuisi G.论文数: 0 引用数: 0 h-index: 0机构: Natl Inst Stand & Technol, Gaithersburg, MD 20899 USA Natl Inst Stand & Technol, Gaithersburg, MD 20899 USA论文数: 引用数: h-index:机构:Fu, Joseph论文数: 0 引用数: 0 h-index: 0机构: Natl Inst Stand & Technol, Gaithersburg, MD 20899 USA Natl Inst Stand & Technol, Gaithersburg, MD 20899 USAAllen, Richard A.论文数: 0 引用数: 0 h-index: 0机构: Natl Inst Stand & Technol, Gaithersburg, MD 20899 USA Natl Inst Stand & Technol, Gaithersburg, MD 20899 USACresswell, Michael论文数: 0 引用数: 0 h-index: 0机构: Natl Inst Stand & Technol, Gaithersburg, MD 20899 USA Natl Inst Stand & Technol, Gaithersburg, MD 20899 USASmith, Stewart论文数: 0 引用数: 0 h-index: 0机构: Natl Inst Stand & Technol, Gaithersburg, MD 20899 USAWalton, Anthony J.论文数: 0 引用数: 0 h-index: 0机构: Natl Inst Stand & Technol, Gaithersburg, MD 20899 USATsiamis, Andreas论文数: 0 引用数: 0 h-index: 0机构: Natl Inst Stand & Technol, Gaithersburg, MD 20899 USA
- [24] Towards Traceable Radiometry in the Terahertz Region2008 33RD INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER AND TERAHERTZ WAVES, VOLS 1 AND 2, 2008, : 483 - 483Mueller, R.论文数: 0 引用数: 0 h-index: 0机构: Phys Tech Bundesanstalt, Abbestr 2-12, D-10587 Berlin, Germany Phys Tech Bundesanstalt, Abbestr 2-12, D-10587 Berlin, GermanyHuebers, H. -W.论文数: 0 引用数: 0 h-index: 0机构: German Aerosp Ctr DLR, D-12489 Berlin, Germany Phys Tech Bundesanstalt, Abbestr 2-12, D-10587 Berlin, GermanyMeindl, P.论文数: 0 引用数: 0 h-index: 0机构: Phys Tech Bundesanstalt, Abbestr 2-12, D-10587 Berlin, Germany Phys Tech Bundesanstalt, Abbestr 2-12, D-10587 Berlin, GermanyRichter, H.论文数: 0 引用数: 0 h-index: 0机构: German Aerosp Ctr DLR, D-12489 Berlin, Germany Phys Tech Bundesanstalt, Abbestr 2-12, D-10587 Berlin, GermanySteiger, A.论文数: 0 引用数: 0 h-index: 0机构: Phys Tech Bundesanstalt, Abbestr 2-12, D-10587 Berlin, Germany Phys Tech Bundesanstalt, Abbestr 2-12, D-10587 Berlin, GermanyWerner, L.论文数: 0 引用数: 0 h-index: 0机构: Phys Tech Bundesanstalt, Abbestr 2-12, D-10587 Berlin, Germany Phys Tech Bundesanstalt, Abbestr 2-12, D-10587 Berlin, Germany
- [25] Towards traceable radiometry in the terahertz regionMETROLOGIA, 2009, 46 (04) : S160 - S164Werner, L.论文数: 0 引用数: 0 h-index: 0机构: Phys Tech Bundesanstalt, D-10587 Berlin, Germany Phys Tech Bundesanstalt, D-10587 Berlin, GermanyHuebers, H.-W.论文数: 0 引用数: 0 h-index: 0机构: German Aerosp Ctr DLR, D-12489 Berlin, Germany Phys Tech Bundesanstalt, D-10587 Berlin, GermanyMeindl, P.论文数: 0 引用数: 0 h-index: 0机构: Phys Tech Bundesanstalt, D-10587 Berlin, Germany Phys Tech Bundesanstalt, D-10587 Berlin, GermanyMueller, R.论文数: 0 引用数: 0 h-index: 0机构: Phys Tech Bundesanstalt, D-10587 Berlin, Germany Phys Tech Bundesanstalt, D-10587 Berlin, GermanyRichter, H.论文数: 0 引用数: 0 h-index: 0机构: German Aerosp Ctr DLR, D-12489 Berlin, Germany Phys Tech Bundesanstalt, D-10587 Berlin, GermanySteiger, A.论文数: 0 引用数: 0 h-index: 0机构: Phys Tech Bundesanstalt, D-10587 Berlin, Germany Phys Tech Bundesanstalt, D-10587 Berlin, Germany
- [26] Traceable nanoscale length metrology using a metrological Scanning Probe MicroscopeSCANNING MICROSCOPY 2010, 2010, 7729论文数: 引用数: h-index:机构:Herrmann, Jan论文数: 0 引用数: 0 h-index: 0机构: Natl Measurement Inst Australia, POB 264, Lindfield, NSW 2070, Australia Natl Measurement Inst Australia, POB 264, Lindfield, NSW 2070, AustraliaFreund, Christopher H.论文数: 0 引用数: 0 h-index: 0机构: Natl Measurement Inst Australia, POB 264, Lindfield, NSW 2070, Australia Natl Measurement Inst Australia, POB 264, Lindfield, NSW 2070, AustraliaMiles, John R.论文数: 0 引用数: 0 h-index: 0机构: Natl Measurement Inst Australia, POB 264, Lindfield, NSW 2070, Australia Natl Measurement Inst Australia, POB 264, Lindfield, NSW 2070, AustraliaGray, Malcolm论文数: 0 引用数: 0 h-index: 0机构: Natl Measurement Inst Australia, POB 264, Lindfield, NSW 2070, Australia Natl Measurement Inst Australia, POB 264, Lindfield, NSW 2070, Australia论文数: 引用数: h-index:机构:Coleman, Victoria A.论文数: 0 引用数: 0 h-index: 0机构: Natl Measurement Inst Australia, POB 264, Lindfield, NSW 2070, Australia Natl Measurement Inst Australia, POB 264, Lindfield, NSW 2070, AustraliaJaemting, Asa K.论文数: 0 引用数: 0 h-index: 0机构: Natl Measurement Inst Australia, POB 264, Lindfield, NSW 2070, Australia Natl Measurement Inst Australia, POB 264, Lindfield, NSW 2070, Australia
- [27] Deploying the high-power pulsed lasers in precision force metrology - Towards SI traceable and practical force quantization by photon momentumTM-TECHNISCHES MESSEN, 2022, 89 (11) : 757 - 777Vasilyan, Suren论文数: 0 引用数: 0 h-index: 0机构: Tech Univ Ilmenau, Inst Proc Measurement & Sensor Technol, D-98693 Ilmenau, Germany Tech Univ Ilmenau, Inst Proc Measurement & Sensor Technol, D-98693 Ilmenau, GermanyFroehlich, Thomas论文数: 0 引用数: 0 h-index: 0机构: Tech Univ Ilmenau, Inst Proc Measurement & Sensor Technol, D-98693 Ilmenau, Germany Tech Univ Ilmenau, Inst Proc Measurement & Sensor Technol, D-98693 Ilmenau, GermanyRogge, Norbert论文数: 0 引用数: 0 h-index: 0机构: Tech Univ Ilmenau, Inst Proc Measurement & Sensor Technol, D-98693 Ilmenau, Germany Tech Univ Ilmenau, Inst Proc Measurement & Sensor Technol, D-98693 Ilmenau, Germany
- [28] Review of SI traceable force metrology for instrumented indentation and atomic force microscopyMEASUREMENT SCIENCE AND TECHNOLOGY, 2005, 16 (11) : 2129 - 2137Pratt, JR论文数: 0 引用数: 0 h-index: 0机构: NIST, Gaithersburg, MD 20899 USA NIST, Gaithersburg, MD 20899 USAKramar, JA论文数: 0 引用数: 0 h-index: 0机构: NIST, Gaithersburg, MD 20899 USA NIST, Gaithersburg, MD 20899 USANewell, DB论文数: 0 引用数: 0 h-index: 0机构: NIST, Gaithersburg, MD 20899 USA NIST, Gaithersburg, MD 20899 USASmith, DT论文数: 0 引用数: 0 h-index: 0机构: NIST, Gaithersburg, MD 20899 USA NIST, Gaithersburg, MD 20899 USA
- [29] Self-traceable angle standards with simplified traceability chain for dimensional metrologyAPPLIED PHYSICS EXPRESS, 2024, 17 (11)Deng, Xiao论文数: 0 引用数: 0 h-index: 0机构: Tongji Univ, Natl Metrol & Testing Ctr Integrated Circuit Measu, Shanghai 200092, Peoples R China Tongji Univ, Inst Precis Opt Engn, Shanghai 200092, Peoples R China Tongji Univ, MOE Key Lab Adv Microstruct Mat, Shanghai 200092, Peoples R China Tongji Univ, Shanghai Frontiers Sci Ctr Digital Opt, Shanghai 200092, Peoples R China Tongji Univ, Shanghai Profess Tech Serv Platform Full Spectrum, Shanghai 200092, Peoples R China Tongji Univ, Sch Phys Sci & Engn, Shanghai 200092, Peoples R China Tongji Univ, Natl Metrol & Testing Ctr Integrated Circuit Measu, Shanghai 200092, Peoples R ChinaShen, Junyu论文数: 0 引用数: 0 h-index: 0机构: Tongji Univ, Natl Metrol & Testing Ctr Integrated Circuit Measu, Shanghai 200092, Peoples R China Tongji Univ, Inst Precis Opt Engn, Shanghai 200092, Peoples R China Tongji Univ, MOE Key Lab Adv Microstruct Mat, Shanghai 200092, Peoples R China Tongji Univ, Shanghai Frontiers Sci Ctr Digital Opt, Shanghai 200092, Peoples R China Tongji Univ, Shanghai Profess Tech Serv Platform Full Spectrum, Shanghai 200092, Peoples R China Tongji Univ, Sch Phys Sci & Engn, Shanghai 200092, Peoples R China Tongji Univ, Natl Metrol & Testing Ctr Integrated Circuit Measu, Shanghai 200092, Peoples R ChinaXiong, Yingfan论文数: 0 引用数: 0 h-index: 0机构: Tongji Univ, Natl Metrol & Testing Ctr Integrated Circuit Measu, Shanghai 200092, Peoples R China Tongji Univ, Inst Precis Opt Engn, Shanghai 200092, Peoples R China Tongji Univ, MOE Key Lab Adv Microstruct Mat, Shanghai 200092, Peoples R China Tongji Univ, Shanghai Frontiers Sci Ctr Digital Opt, Shanghai 200092, Peoples R China Tongji Univ, Shanghai Profess Tech Serv Platform Full Spectrum, Shanghai 200092, Peoples R China Tongji Univ, Sch Phys Sci & Engn, Shanghai 200092, Peoples R China Tongji Univ, Natl Metrol & Testing Ctr Integrated Circuit Measu, Shanghai 200092, Peoples R ChinaGou, Jinming论文数: 0 引用数: 0 h-index: 0机构: Tongji Univ, Natl Metrol & Testing Ctr Integrated Circuit Measu, Shanghai 200092, Peoples R China Tongji Univ, Inst Precis Opt Engn, Shanghai 200092, Peoples R China Tongji Univ, MOE Key Lab Adv Microstruct Mat, Shanghai 200092, Peoples R China Tongji Univ, Shanghai Frontiers Sci Ctr Digital Opt, Shanghai 200092, Peoples R China Tongji Univ, Shanghai Profess Tech Serv Platform Full Spectrum, Shanghai 200092, Peoples R China Tongji Univ, Sch Phys Sci & Engn, Shanghai 200092, Peoples R China Tongji Univ, Natl Metrol & Testing Ctr Integrated Circuit Measu, Shanghai 200092, Peoples R ChinaTang, Zhaohui论文数: 0 引用数: 0 h-index: 0机构: Tongji Univ, Natl Metrol & Testing Ctr Integrated Circuit Measu, Shanghai 200092, Peoples R China Tongji Univ, Inst Precis Opt Engn, Shanghai 200092, Peoples R China Tongji Univ, MOE Key Lab Adv Microstruct Mat, Shanghai 200092, Peoples R China Tongji Univ, Shanghai Frontiers Sci Ctr Digital Opt, Shanghai 200092, Peoples R China Tongji Univ, Shanghai Profess Tech Serv Platform Full Spectrum, Shanghai 200092, Peoples R China Tongji Univ, Sch Phys Sci & Engn, Shanghai 200092, Peoples R China Tongji Univ, Natl Metrol & Testing Ctr Integrated Circuit Measu, Shanghai 200092, Peoples R ChinaXiao, Guangxu论文数: 0 引用数: 0 h-index: 0机构: Tongji Univ, Natl Metrol & Testing Ctr Integrated Circuit Measu, Shanghai 200092, Peoples R China Tongji Univ, Inst Precis Opt Engn, Shanghai 200092, Peoples R China Tongji Univ, MOE Key Lab Adv Microstruct Mat, Shanghai 200092, Peoples R China Tongji Univ, Shanghai Frontiers Sci Ctr Digital Opt, Shanghai 200092, Peoples R China Tongji Univ, Shanghai Profess Tech Serv Platform Full Spectrum, Shanghai 200092, Peoples R China Tongji Univ, Sch Phys Sci & Engn, Shanghai 200092, Peoples R China Tongji Univ, Natl Metrol & Testing Ctr Integrated Circuit Measu, Shanghai 200092, Peoples R ChinaYin, Zhijun论文数: 0 引用数: 0 h-index: 0机构: Tongji Univ, Natl Metrol & Testing Ctr Integrated Circuit Measu, Shanghai 200092, Peoples R China Tongji Univ, Inst Precis Opt Engn, Shanghai 200092, Peoples R China Tongji Univ, MOE Key Lab Adv Microstruct Mat, Shanghai 200092, Peoples R China Tongji Univ, Shanghai Frontiers Sci Ctr Digital Opt, Shanghai 200092, Peoples R China Tongji Univ, Shanghai Profess Tech Serv Platform Full Spectrum, Shanghai 200092, Peoples R China Tongji Univ, Sch Phys Sci & Engn, Shanghai 200092, Peoples R China Tongji Univ, Natl Metrol & Testing Ctr Integrated Circuit Measu, Shanghai 200092, Peoples R ChinaXue, Dongbai论文数: 0 引用数: 0 h-index: 0机构: Tongji Univ, Natl Metrol & Testing Ctr Integrated Circuit Measu, Shanghai 200092, Peoples R China Tongji Univ, Inst Precis Opt Engn, Shanghai 200092, Peoples R China Tongji Univ, MOE Key Lab Adv Microstruct Mat, Shanghai 200092, Peoples R China Tongji Univ, Shanghai Frontiers Sci Ctr Digital Opt, Shanghai 200092, Peoples R China Tongji Univ, Shanghai Profess Tech Serv Platform Full Spectrum, Shanghai 200092, Peoples R China Tongji Univ, Sch Phys Sci & Engn, Shanghai 200092, Peoples R China Tongji Univ, Natl Metrol & Testing Ctr Integrated Circuit Measu, Shanghai 200092, Peoples R ChinaShi, Yushu论文数: 0 引用数: 0 h-index: 0机构: Natl Inst Metrol, Beijing 100029, Peoples R China Shenzhen Inst Technol Innovat, Natl Inst Metrol, Shenzhen 518107, Peoples R China Tongji Univ, Natl Metrol & Testing Ctr Integrated Circuit Measu, Shanghai 200092, Peoples R ChinaShi, Zhoumiao论文数: 0 引用数: 0 h-index: 0机构: Shenzhen Inst Technol Innovat, Natl Inst Metrol, Shenzhen 518107, Peoples R China Tongji Univ, Natl Metrol & Testing Ctr Integrated Circuit Measu, Shanghai 200092, Peoples R ChinaXie, Yuying论文数: 0 引用数: 0 h-index: 0机构: Tongji Univ, Natl Metrol & Testing Ctr Integrated Circuit Measu, Shanghai 200092, Peoples R China Tongji Univ, Inst Precis Opt Engn, Shanghai 200092, Peoples R China Tongji Univ, MOE Key Lab Adv Microstruct Mat, Shanghai 200092, Peoples R China Tongji Univ, Shanghai Frontiers Sci Ctr Digital Opt, Shanghai 200092, Peoples R China Tongji Univ, Shanghai Profess Tech Serv Platform Full Spectrum, Shanghai 200092, Peoples R China Tongji Univ, Sch Phys Sci & Engn, Shanghai 200092, Peoples R China Tongji Univ, Natl Metrol & Testing Ctr Integrated Circuit Measu, Shanghai 200092, Peoples R ChinaCheng, Xinbin论文数: 0 引用数: 0 h-index: 0机构: Tongji Univ, Natl Metrol & Testing Ctr Integrated Circuit Measu, Shanghai 200092, Peoples R China Tongji Univ, Inst Precis Opt Engn, Shanghai 200092, Peoples R China Tongji Univ, MOE Key Lab Adv Microstruct Mat, Shanghai 200092, Peoples R China Tongji Univ, Shanghai Frontiers Sci Ctr Digital Opt, Shanghai 200092, Peoples R China Tongji Univ, Shanghai Profess Tech Serv Platform Full Spectrum, Shanghai 200092, Peoples R China Tongji Univ, Sch Phys Sci & Engn, Shanghai 200092, Peoples R China Tongji Univ, Natl Metrol & Testing Ctr Integrated Circuit Measu, Shanghai 200092, Peoples R ChinaLi, Tongbao论文数: 0 引用数: 0 h-index: 0机构: Tongji Univ, Natl Metrol & Testing Ctr Integrated Circuit Measu, Shanghai 200092, Peoples R China Tongji Univ, Inst Precis Opt Engn, Shanghai 200092, Peoples R China Tongji Univ, MOE Key Lab Adv Microstruct Mat, Shanghai 200092, Peoples R China Tongji Univ, Shanghai Frontiers Sci Ctr Digital Opt, Shanghai 200092, Peoples R China Tongji Univ, Shanghai Profess Tech Serv Platform Full Spectrum, Shanghai 200092, Peoples R China Tongji Univ, Sch Phys Sci & Engn, Shanghai 200092, Peoples R China Tongji Univ, Natl Metrol & Testing Ctr Integrated Circuit Measu, Shanghai 200092, Peoples R China
- [30] Traceable quantum sensing and metrology relied up a quantum electrical triangle principleQUANTUM AND NONLINEAR OPTICS IV, 2016, 10029Fang, Yan论文数: 0 引用数: 0 h-index: 0机构: Fudan Univ, Zhong Shan Hosp, Dept Anesthesiol, 136 Yi Xue Yuan Rd, Shanghai 200032, Peoples R China Fudan Univ, Zhong Shan Hosp, Dept Anesthesiol, 136 Yi Xue Yuan Rd, Shanghai 200032, Peoples R ChinaWang, Hengliang论文数: 0 引用数: 0 h-index: 0机构: Fudan Univ, Publ Lab Micro Nano Fabricat & Device Proc, 220 Han Dan Rd, Shanghai 200433, Peoples R China Fudan Univ, Zhong Shan Hosp, Dept Anesthesiol, 136 Yi Xue Yuan Rd, Shanghai 200032, Peoples R ChinaYang, Xinju论文数: 0 引用数: 0 h-index: 0机构: Fudan Univ, State Lab Appl Surface Phys, 220 Han Dan Rd, Shanghai 200433, Peoples R China Fudan Univ, Zhong Shan Hosp, Dept Anesthesiol, 136 Yi Xue Yuan Rd, Shanghai 200032, Peoples R ChinaWei, Jinsong论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Shanghai 201800, Peoples R China Fudan Univ, Zhong Shan Hosp, Dept Anesthesiol, 136 Yi Xue Yuan Rd, Shanghai 200032, Peoples R China