Traceable Metrology for Single Photon Detection Characterization

被引：0
|
作者：
Jing, Zhang [1 ]
Mingze, Ian Foo [1 ]
机构：
[1] Agcy Sci Technol & Res, Natl Metrol Ctr, Singapore, Singapore
来源：
2017 OPTO-ELECTRONICS AND COMMUNICATIONS CONFERENCE (OECC) AND PHOTONICS GLOBAL CONFERENCE (PGC) | 2017年
关键词：
single photon counting; detection probability; linearity; uncertainty;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We present a single photon counting measurement setup and characterize a Single Photon Counting Module (SPCM) by determining the measurement result for photon detection probability and linearity. The measurements were made by using calibrated photodetectors and calibrated attenuators, and are traceable to the cryogenic radiometer-based primary standard. A detailed measurement uncertainty analysis will be provided.
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页数：4
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