Accelerated aging and thermal cycling of low melting temperature alloys as wet thermal interface materials

被引:25
|
作者
Roy, Chandan K. [1 ]
Bhavnani, Sushi [1 ]
Hamilton, Michael C. [2 ]
Johnson, R. Wayne [3 ]
Knight, Roy W. [1 ]
Harris, Daniel K. [1 ]
机构
[1] Auburn Univ, Dept Mech Engn, Auburn, AL 36849 USA
[2] Auburn Univ, Dept Elect & Comp Engn, Auburn, AL 36849 USA
[3] Tennessee Technol Univ, Dept Elect & Comp Engn, Cookeville, TN USA
关键词
Low melt alloys; Thermal interface material; Thermal resistance; Thermal aging; Thermal cycling; PERFORMANCE;
D O I
10.1016/j.microrel.2015.08.020
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper focuses on developing an effective thermal interface material (TIM) using low melt alloys (LMAs) containing gallium (Ga), indium (In), bismuth (Bi) and tin (Sn). The investigation described herein involved the thermal performance evaluation of LMAs after accelerated life cycle testing, which included isothermal aging at 130 degrees C and thermal cycling from -40 degrees C to 80 degrees C. Three alloys (75.5Ga/24.5In, 100Ga, and 51In/32.5Bi/16.5Sn) were chosen as candidate LMA TIMs. The testing methodologies followed ASTM D5470 protocols and the performance of the alloys was compared to commercially available thermal grease and liquid metal TIMs. To understand the LMA-substrate interactions, the alloys were applied to different surfaces (bare copper, nickel coated copper and tungsten coated copper). It was found that the proposed alloys between bare copper substrates were able to survive as long as 2700 h of aging at 130 degrees C and 1400 cycles from -40 degrees C to 80 degrees C without significant performance degradation. (C) 2015 Elsevier Ltd. All rights reserved.
引用
收藏
页码:2698 / 2704
页数:7
相关论文
共 50 条
  • [31] Study on thermal contact resistance of low melting alloy used as thermal interface material
    Swamy, Mc Kumar
    Satyanarayan
    Pinto, Richard
    MATERIALS TODAY-PROCEEDINGS, 2022, 66 : 2508 - 2512
  • [32] Intermediate Low-Melting-Temperature Solder Thermal Cycling Enhancement Using Bismuth and Indium Microalloying
    Lee, Young-Woo
    Lee, Tae-Kyu
    Jung, Jae-Pil
    JOURNAL OF ELECTRONIC MATERIALS, 2023, 52 (02) : 810 - 818
  • [33] Intermediate Low-Melting-Temperature Solder Thermal Cycling Enhancement Using Bismuth and Indium Microalloying
    Young-Woo Lee
    Tae-Kyu Lee
    Jae-Pil Jung
    Journal of Electronic Materials, 2023, 52 : 810 - 818
  • [34] Low temperature thermal cycling as a refining treatment of titanium
    Waermeermuedung im Tieftemperatur-bereich
    Ziaja, J., 1600, (44):
  • [35] Extended thermal cycling of miscibility gap alloy high temperature thermal storage materials
    Reed, Samuel
    Sugo, Heber
    Kisi, Erich
    Richardson, Peter
    SOLAR ENERGY, 2019, 185 : 333 - 340
  • [36] A SENSITIVE METHOD FOR THERMAL ANALYSIS OF VERY LOW MELTING ALLOYS
    EVANS, RM
    FROMM, EO
    JAFFEE, RI
    JOURNAL OF METALS, 1952, 4 (01): : 74 - 75
  • [37] A SENSITIVE METHOD FOR THERMAL ANALYSIS OF VERY LOW MELTING ALLOYS
    EVANS, RM
    FROMM, EO
    JAFFEE, RI
    TRANSACTIONS OF THE AMERICAN INSTITUTE OF MINING AND METALLURGICAL ENGINEERS, 1952, 194 (01): : 74 - 75
  • [38] Mechanical Cycling Reliability Testing of Thermal Interface Materials for Semiconductor Test
    Saums, David L.
    Jensen, Tim
    Gowans, Carol
    Hunadi, Ron
    Ras, Mohamad Abo
    2019 35TH SEMICONDUCTOR THERMAL MEASUREMENT, MODELING AND MANAGEMENT SYMPOSIUM (SEMI-THERM), 2019, : 38 - 44
  • [39] Accelerated thermal aging of three-core power cable thermal aging rule and mechanism of typical insulating materials
    Du, Chengqian
    Wang, Wei
    Gao, Shicheng
    Tan, Jintao
    2024 THE 7TH INTERNATIONAL CONFERENCE ON ENERGY, ELECTRICAL AND POWER ENGINEERING, CEEPE 2024, 2024, : 316 - 323
  • [40] Thermal characterization of thermal interface materials
    Chen, C. I.
    Ni, C. Y.
    Chang, C. M.
    Liu, D. S.
    Pan, H. Y.
    Yuan, T. D.
    EXPERIMENTAL TECHNIQUES, 2008, 32 (03) : 48 - 52