Accelerated aging and thermal cycling of low melting temperature alloys as wet thermal interface materials

被引:25
|
作者
Roy, Chandan K. [1 ]
Bhavnani, Sushi [1 ]
Hamilton, Michael C. [2 ]
Johnson, R. Wayne [3 ]
Knight, Roy W. [1 ]
Harris, Daniel K. [1 ]
机构
[1] Auburn Univ, Dept Mech Engn, Auburn, AL 36849 USA
[2] Auburn Univ, Dept Elect & Comp Engn, Auburn, AL 36849 USA
[3] Tennessee Technol Univ, Dept Elect & Comp Engn, Cookeville, TN USA
关键词
Low melt alloys; Thermal interface material; Thermal resistance; Thermal aging; Thermal cycling; PERFORMANCE;
D O I
10.1016/j.microrel.2015.08.020
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper focuses on developing an effective thermal interface material (TIM) using low melt alloys (LMAs) containing gallium (Ga), indium (In), bismuth (Bi) and tin (Sn). The investigation described herein involved the thermal performance evaluation of LMAs after accelerated life cycle testing, which included isothermal aging at 130 degrees C and thermal cycling from -40 degrees C to 80 degrees C. Three alloys (75.5Ga/24.5In, 100Ga, and 51In/32.5Bi/16.5Sn) were chosen as candidate LMA TIMs. The testing methodologies followed ASTM D5470 protocols and the performance of the alloys was compared to commercially available thermal grease and liquid metal TIMs. To understand the LMA-substrate interactions, the alloys were applied to different surfaces (bare copper, nickel coated copper and tungsten coated copper). It was found that the proposed alloys between bare copper substrates were able to survive as long as 2700 h of aging at 130 degrees C and 1400 cycles from -40 degrees C to 80 degrees C without significant performance degradation. (C) 2015 Elsevier Ltd. All rights reserved.
引用
收藏
页码:2698 / 2704
页数:7
相关论文
共 50 条
  • [21] Low melting point thermal interface material
    Webb, RL
    Gwinn, JP
    ITHERM 2002: EIGHTH INTERSOCIETY CONFERENCE ON THERMAL AND THERMOMECHANICAL PHENOMENA IN ELECTRONIC SYSTEMS, PROCEEDINGS, 2002, : 671 - 676
  • [22] Thermal Performance Characterization of Nano Thermal Interface Materials after Power Cycling
    Sun, Shuangxi
    Xin, Luo
    Zanden, Carl
    Carlberg, Bjorn
    Ye, Lilei
    Liu, Johan
    2012 IEEE 62ND ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2012, : 1426 - 1430
  • [23] Thermal stability of organic Phase Change Materials (PCMs) by accelerated thermal cycling technique
    Katish, Mohamed
    Allen, Stephen
    Squires, Adam
    Ferrandiz-Mas, Veronica
    THERMOCHIMICA ACTA, 2024, 737
  • [24] Thermal cycling induced interconnect stability degradation mechanism in low melting temperature solder joints
    Young, Kendra
    Aspandiar, Raiyo
    Badwe, Nilesh
    Walwadkar, Satyajit
    Lee, Young-Woo
    Lee, Tae-Kyu
    IEEE 72ND ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC 2022), 2022, : 1199 - 1205
  • [25] Effects of surface roughness, temperature and pressure on interface thermal resistance of thermal interface materials
    Zhao, Jian-Wei
    Zhao, Rui
    Huo, Yan-Kai
    Cheng, Wen-Long
    INTERNATIONAL JOURNAL OF HEAT AND MASS TRANSFER, 2019, 140 : 705 - 716
  • [26] Thermal Conductivity Determination of Ga-In Alloys for Thermal Interface Materials Design
    Maivald, Parker
    Sridar, Soumya
    Xiong, Wei
    THERMO, 2022, 2 (01): : 1 - 13
  • [27] Accelerated aging versus realistic aging in aerospace composite materials. I. The chemistry of thermal aging in a low-temperature-cure epoxy composite
    Dao, B.
    Hodgkin, J.
    Krstina, J.
    Mardel, J.
    Tian, W.
    JOURNAL OF APPLIED POLYMER SCIENCE, 2006, 102 (05) : 4291 - 4303
  • [28] Aging behaviour of encapsulated assemblies of epoxy resin under accelerated thermal cycling
    Yan, Han
    Wang, Pengli
    Li, Ruiqi
    Xu, Zhiwu
    INTERNATIONAL JOURNAL OF POLYMER ANALYSIS AND CHARACTERIZATION, 2022, 27 (03) : 180 - 194
  • [29] A low-melting-point alloy filled epoxy conductive adhesives as thermal interface materials
    Kang, Jia-Hui
    Sheng, Jia-Li
    Fu, Xian-Zhu
    Sun, Rong
    Wong, Ching-Ping
    2017 18TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT), 2017, : 831 - 834
  • [30] Silver-based Thermal Interface Materials with Low Thermal Resistance
    Yu, Hui
    Zhang, Rui
    Li, Liangliang
    Mao, Xiaofei
    Du, Hongda
    2012 13TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY & HIGH DENSITY PACKAGING (ICEPT-HDP 2012), 2012, : 409 - 412