Characterization of ferroelectric thin-film planar microwave devices using the Method of Line (MoL)

被引：0
|
作者：
Giraud, S. [1 ]
Courreges, S. [1 ]
Cros, D. [1 ]
Madrangeas, V. [1 ]
机构：
[1] IRCOM, UMR 6615, F-87060 Limoges, France
来源：
35th European Microwave Conference, Vols 1-3, Conference Proceedings | 2005年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The characterization of ferroelectric thin-film planar microwave devices using the Method of Line (MoL) has been summarized in this paper. Because the permittivity-de electric field dependence in ferroelectric materials is used to tune microwave devices, it is necessary to develop a suitable analysis method to accurately characterize ferroelectric materials. This paper presents first results of 2D analysis of tunable planar devices.
引用
收藏
页码：513 / 516
页数：4
相关论文
共 50 条
  • [21] CHARACTERIZATION OF FERROELECTRIC LITAO3 THIN-FILM
    KANDUSER, A
    MANDRINO, D
    KOSEC, M
    PANJAN, P
    LAVRENCIC, BB
    FERROELECTRICS, 1992, 134 (1-4) : 223 - 228
  • [22] Reduced Size Frequency Agile Microwave Circuits Using Ferroelectric Thin-Film Varactors
    Lourandakis, Errikos
    Schmidt, Matthias
    Seitz, Stefan
    Weigel, Robert
    IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2008, 56 (12) : 3093 - 3099
  • [23] Planar tunable HTS microwave filter with patterned ferroelectric thin film
    Tan, CY
    Ong, CK
    SUPERCONDUCTOR SCIENCE & TECHNOLOGY, 2006, 19 (02): : 212 - 216
  • [24] Coupled microstrip line microwave phase shifter using ferroelectric thin film varactors
    Sheng, Su
    Ong, C. K.
    JOURNAL OF APPLIED PHYSICS, 2012, 111 (04)
  • [25] Nonlinear Effects in Thin-Film Ferroelectric Transmission Lines at Microwave Frequencies
    Booth, James C.
    Orloff, Nathan D.
    Mateu, Jordi M.
    2008 17TH IEEE INTERNATIONAL SYMPOSIUM ON THE APPLICATIONS OF FERROELECTRICS, 2008, : 266 - +
  • [26] Thin-film Multiferroic Heterostructures for Dual Tunable Microwave Devices
    Nikitin, A. A.
    Ustinov, A. B.
    Semenov, A. A.
    Lahderanta, E.
    2014 44TH EUROPEAN MICROWAVE CONFERENCE (EUMC), 2014, : 1182 - 1185
  • [27] Microwave losses in metal-ferroelectric-metal thin-film capacitors
    M. M. Gaĭdukov
    A. G. Gagarin
    A. B. Kozyrev
    S. V. Razumov
    A. V. Tumarkin
    A. G. Altynnikov
    Technical Physics Letters, 2008, 34 : 565 - 567
  • [28] Additive Manufacturing of Ferroelectric-Oxide Thin-Film Multilayer Devices
    Matavz, Aleksander
    Bencan, Andreja
    Kovac, Janez
    Chung, Ching-Chang
    Jones, Jacob L.
    Trolier-McKinstry, Susan
    Malic, Barbara
    Bobnar, Vid
    ACS APPLIED MATERIALS & INTERFACES, 2019, 11 (48) : 45155 - 45160
  • [29] Microwave losses in metal-ferroelectric-metal thin-film capacitors
    Gaidukov, M. M.
    Gagarin, A. G.
    Kozyrev, A. B.
    Razumov, S. V.
    Tumarkin, A. V.
    Altynnikov, A. G.
    TECHNICAL PHYSICS LETTERS, 2008, 34 (07) : 565 - 567
  • [30] Models of electrode-dielectric interfaces in ferroelectric thin-film devices
    Dawber, M
    Scott, JF
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2002, 41 (11B): : 6848 - 6851
12345