Magnetization reversal phenomena in submicron magnetic wire systems were investigated from magnetoresistance measurements. Wire arrays and also single wire samples consisting of two magnetic layers with different coercivities were prepared and the resistivity was measured by applying external magnetic fields. Owing to the non-coupled type of giant magnetoresistance effect, the resistivity of wires is enhanced in proportion to the relative area of antiparallel magnetization. It is demonstrated that the resistivity measurements can sensitively detect the magnetization reversal phenomena in submicron wires. The dynamic properties of domain walls in wire samples are studied and the velocity of domain wall propagation is estimated.