Magnetization reversal study in submicron half-ring patterned wires with different corner structures

被引:1
|
作者
Yu, C [1 ]
Chen, YS
Yao, YD
Cheng, KW
Lee, SF
Wu, KT
Liou, Y
机构
[1] Acad Sinica, Inst Phys, Taipei 115, Taiwan
[2] Fu Jen Catholic Univ, Dept Phys, Taipei 242, Taiwan
关键词
D O I
10.1063/1.2173223
中图分类号
O59 [应用物理学];
学科分类号
摘要
Magnetization reversal phenomena in submicron half-ring patterned wires with different corner structures have been investigated. The wires with corner structures of rectangular, semicircle, and triangular shapes were connected in series by two or five half-rings. The variation of domain structures with magnetic field is illustrated by electron transport measurements, simulation, and magnetic force microscopy (MFM) images. The switching behavior depends on the corner structures connecting the half-ring structures. These results are consistent with the domain pattern and magnetic phase shift observation provided by the MFM measurements. (C) 2006 American Institute of Physics.
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页数:3
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