I-V hysteresis characteristics of nano-field effect transistor (nanoFET) sensor with a floating metal gate electrode

被引:2
|
作者
Kang, Hye-Lim [1 ]
Yoon, Sumi [1 ]
Hong, Dong-Ki [1 ]
Kim, Won-Hyo [1 ]
Seong, Woo Kyeong [1 ]
Lee, Kook-Nyung [1 ]
机构
[1] KETI, Humancare Syst Res Ctr, Gyeonggi 13509, South Korea
关键词
nanoFET sensor; Floating metal gate; Hysteresis; Repeatable ion detection; Back-gate sweep; BIOSENSORS; IONS;
D O I
10.1016/j.mee.2019.04.014
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A sensor based on a nano-field-effect transistor (nanoFET) can detect airborne charged substances and biomolecules or in a liquid environment in real time and a label-free manner. The approach is based on the principle of chemical gating, which is induced by the adsorption of charged substances on the surface of the FET channel. This study involved the fabrication of a nanoFET sensor with a top metal-gate electrode structure and the analysis of its I-V characteristics to assess its repeatability with respect to detecting airborne anions. We show that the I-V characteristics of the nanoFET sensor with a top metal gate electrode are affected by the capacitive coupling between the top metal sensing gate and the bottom back-gate by double sweeping the back-gate voltage. The proposed method to refresh and reinitialize the sensor is proven experimentally by recording the hysteresis of the nanoFET sensor with the top metal gate electrode. Consequently, the nanoFET sensor with an electrode with a top metal sensing gate could be reset by sweeping the back-gate bias voltage of the nanoFET device and show that the proposed structure is essential to reinitialize the sensor after the measurement. These properties of the nanoFET device with the top metal gate electrode enable the nanoFET sensor to be reinitialized by using only back-gate voltage sweep, contrary to the sensor without the metal gate.
引用
收藏
页码:35 / 40
页数:6
相关论文
共 50 条
  • [21] Ion balance detection using nano field-effect transistor with an extended gate electrode
    Hye-Lim Kang
    Sumi Yoon
    Dong-Ki Hong
    Won-Hyo Kim
    Woo Kyeong Seong
    Kook-Nyung Lee
    Micro and Nano Systems Letters, 8
  • [22] Organic field-effect transistor nonvolatile memories based on hybrid nano-floating-gate
    Gao, Xu
    She, Xiao-Jian
    Liu, Chang-Hai
    Sun, Qi-Jun
    Liu, Jie
    Wang, Sui-Dong
    APPLIED PHYSICS LETTERS, 2013, 102 (02)
  • [23] Morphology and collective I-V characteristics of template synthesized nano metal-semiconductor heterojunctions
    Kumar, Rajesh
    Chaudhari, Meeru
    Chakarvarti, S. K.
    MATERIALS LETTERS, 2007, 61 (07) : 1580 - 1582
  • [24] Influence of Source/Drain Residual Implant Lattice Damage Traps on Silicon Carbide Metal Semiconductor Field-Effect Transistor Drain I-V Characteristics
    Adjaye, J.
    Mazzol, M. S.
    INTERNATIONAL CONFERENCE ON SOLID STATE DEVICES AND MATERIALS SCIENCE, 2012, 25 : 158 - 169
  • [25] Simulation of I-V characteristics of Josephson junctions array:: magnetic field effect
    Khan, JA
    Shahabuddin, M
    INDIAN JOURNAL OF PHYSICS, 2004, 78 (08) : 841 - 844
  • [26] The dependence of Schottky junction (I-V) characteristics on the metal probe size in nano metal-semiconductor contacts
    Rezeq, Moh'd
    Ali, Ahmed
    Patole, Shashikant P.
    Eledlebi, Khouloud
    Dey, Ripon Kumar
    Cui, Bo
    AIP ADVANCES, 2018, 8 (05)
  • [28] New submicron and deep-submicron metal-oxide-semiconductor field-effect-transistor I-V and C-V model
    Jang, Sh.-L.
    Liu, Sh.-Sh.
    Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers, 1998, 37 (07): : 3942 - 3947
  • [29] New submicron and deep-submicron metal-oxide-semiconductor field-effect-transistor I-V and C-V model
    Jang, SL
    Liu, SS
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1998, 37 (07): : 3942 - 3947
  • [30] HYSTERESIS IN GAAS METAL-SEMICONDUCTOR FIELD-EFFECT TRANSISTORS-I-TRANSISTORS-V CHARACTERISTICS
    LAU, WM
    JI, LJ
    LOWE, K
    TANG, W
    YOUNG, L
    CANADIAN JOURNAL OF PHYSICS, 1985, 63 (06) : 748 - 752