I-V hysteresis characteristics of nano-field effect transistor (nanoFET) sensor with a floating metal gate electrode

被引:2
|
作者
Kang, Hye-Lim [1 ]
Yoon, Sumi [1 ]
Hong, Dong-Ki [1 ]
Kim, Won-Hyo [1 ]
Seong, Woo Kyeong [1 ]
Lee, Kook-Nyung [1 ]
机构
[1] KETI, Humancare Syst Res Ctr, Gyeonggi 13509, South Korea
关键词
nanoFET sensor; Floating metal gate; Hysteresis; Repeatable ion detection; Back-gate sweep; BIOSENSORS; IONS;
D O I
10.1016/j.mee.2019.04.014
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A sensor based on a nano-field-effect transistor (nanoFET) can detect airborne charged substances and biomolecules or in a liquid environment in real time and a label-free manner. The approach is based on the principle of chemical gating, which is induced by the adsorption of charged substances on the surface of the FET channel. This study involved the fabrication of a nanoFET sensor with a top metal-gate electrode structure and the analysis of its I-V characteristics to assess its repeatability with respect to detecting airborne anions. We show that the I-V characteristics of the nanoFET sensor with a top metal gate electrode are affected by the capacitive coupling between the top metal sensing gate and the bottom back-gate by double sweeping the back-gate voltage. The proposed method to refresh and reinitialize the sensor is proven experimentally by recording the hysteresis of the nanoFET sensor with the top metal gate electrode. Consequently, the nanoFET sensor with an electrode with a top metal sensing gate could be reset by sweeping the back-gate bias voltage of the nanoFET device and show that the proposed structure is essential to reinitialize the sensor after the measurement. These properties of the nanoFET device with the top metal gate electrode enable the nanoFET sensor to be reinitialized by using only back-gate voltage sweep, contrary to the sensor without the metal gate.
引用
收藏
页码:35 / 40
页数:6
相关论文
共 50 条
  • [1] I-V characteristics of a ferroelectric field effect transistor
    MacLeod, TC
    Ho, FD
    INTEGRATED FERROELECTRICS, 2001, 34 (1-4) : 1461 - 1466
  • [2] An Empirical Model for Static I-V Characteristics of Double Gate Tunneling Field Effect Transistor
    Huang, D. M.
    Yao, C. J.
    Shi, D. H.
    Li, M. F.
    2013 IEEE 10TH INTERNATIONAL CONFERENCE ON ASIC (ASICON), 2013,
  • [3] Nano-field effect transistor with an organic self-assembled monolayer as gate insulator
    Collett, J
    Vuillaume, D
    APPLIED PHYSICS LETTERS, 1998, 73 (18) : 2681 - 2683
  • [4] Quantum transport and I-V characteristics of quantum size field effect transistor
    Fu, Y
    Karlsteen, M
    Willander, M
    Collaert, N
    De Meyer, K
    SUPERLATTICES AND MICROSTRUCTURES, 1998, 24 (02) : 111 - 118
  • [5] I-V and Gain Characteristics of Electrowetting-Based Liquid Field Effect Transistor
    Kim, Duk Young
    Herman, Stephen
    Steckl, Andrew J.
    2008 17TH BIENNIAL UNIVERSITY/GOVERNMENT/INDUSTRY MICRO-NANO SYMPOSIUM, PROCEEDINGS, 2008, : 2 - 5
  • [6] The hysteresis effect of I-V characteristics in YBaCuO edge junction
    Chen, L
    Zhang, YH
    PHYSICA C, 2000, 341 : 271 - 272
  • [7] Random switchings and hysteresis in I-V characteristics of short-gate GaAs structures
    Safonov, SS
    Savchenko, AK
    Tribe, WR
    Linfield, EH
    PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 2000, 218 (01): : 145 - 150
  • [8] Effect of external field on the I-V characteristics through the molecular nano-junction
    Niu Lu
    Wang Lu-Xia
    ACTA PHYSICA SINICA, 2018, 67 (02)
  • [9] Gas Sensor Based on lnterdigitated Gate Electrode Field Effect Transistor
    Frank Lewis
    Edward S.Kolesar
    稀有金属材料与工程, 2006, (S3) : 140 - 142
  • [10] Gas sensor based on interdigitated gate electrode field effect transistor
    Zhang, Tong
    Qiang, Sheng
    Lewis, Frank
    Kolesar, Edward S.
    Wu, Yalin
    Chi, Xiaozhu
    Zhang, Hongquan
    RARE METAL MATERIALS AND ENGINEERING, 2006, 35 : 140 - 142