Methodology to Design-For-Testability Automation for Mixed-Signal Integrated Circuits

被引：0
|
作者：
Mosin, Sergey [1 ]
机构：
[1] Vladimir State Univ, Dept Comp Engn, Vladimir, Russia
来源：
PROCEEDINGS OF IEEE EAST-WEST DESIGN & TEST SYMPOSIUM (EWDTS 2013) | 2013年
关键词：
ANALOG;
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
The methodology of design-for-testability automation of mixed-signal IC is proposed. Functional model of DFT automation is presented as IDEF0-diagram based on the system analysis. The list of data of the model's four basic sets (Input, Control, Tools and Output) required for design automation is specified. The purpose and principal realization of the key processes in the model such as simulation, test generation, testing subcircuits generation and decision making are considered. The criteria of selecting an effective DFT-solution for particular circuit design are proposed. Experimental results of the methodology application for analog-digital voice frequency codec are presented.
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页数：6
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