The characterisation of rough particle contacts by atomic force microscopy

An Atomic Force Microscopy (AFM) reverse imaging technique has been used to determine the contact zone topography of glass and UO3 particles in contact with flat mica Substrates. A method is proposed that uses this topography to determine an effective asperity radius of curvature for the contacting particle. Application of the method has been found to be consistent with established contact mechanics models, for both glass and UO3 particle probes that present significantly different surface roughness. The method proposed is straightforward to apply and offers a greater insight into the influence of particle micro- and nano-roughness on adhesion. This is important for applications that rely on the control of granular flow such as pellet or tablet manufacture. (c) 2006 Elsevier Inc. All rights reserved.