Dynamics of localized carriers in InGaN multi-quantum wells

被引:0
|
作者
Kyhm, K. [1 ]
Taylor, R. A.
机构
[1] Pusan Natl Univ, Dept Phys, Pusan 609735, South Korea
[2] Pusan Natl Univ, Res Ctr Dielect & Adv Matter Phys, Pusan 609735, South Korea
[3] Univ Oxford, Dept Phys, Clarendon Lab, Oxford OX1 3PU, England
关键词
localized exciton; time-resolved photoluminescence; quantum well structures;
D O I
暂无
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Time-resolved photoluminescence measurements are performed in a In0.02Ga0.98N/In0.16Ga0.84N multiple-quantum well structure in order to investigate the spontaneous emission mechanism. The radiative and the non-radiative recombination times are deduced from the photoluminescence decay times using the temperature-dependent internal quantum efficiency measured from the temperature-dependent normalized photoluminescence intensity. We found that the radiative recombination time has a linear temperature-dependence for T <= 100 K, consistent with the two-dimensional nature of excitons. This suggests that at low temperatures 2D excitons are weakly localized at the potential minima in the quantum well.
引用
收藏
页码:538 / 541
页数:4
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