Study on Automatic Defect Report Classification System with Self Attention Visualization

被引:0
|
作者
Hirakawa, Rin [1 ]
Tominaga, Keitaro [2 ]
Nakatoh, Yoshihisa [1 ]
机构
[1] Kyushu Inst Technol, Kitakyushu, Fukuoka, Japan
[2] Panasonic Syst Design Co Ltd, Yokohama, Kanagawa, Japan
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In recent years, software in devices such as smartphones and tablets has become increasingly multifunctional, and the use of OSS has become essential. In software development using large-scale OSS, it is important to report defects to appropriate personnel promptly. In this paper, we propose a method to classifying defect reports into appropriate categories using fine-tuned BERT and visualize self-attention information. In the evaluation, category classification was performed using defect reports of the actual OSS project. The F1 score was 0.87, which indicated that high-accuracy classification was possible. Also, the visualization results show that category-specific words can be extracted.
引用
收藏
页码:60 / 61
页数:2
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