Study on Automatic Defect Report Classification System with Self Attention Visualization

被引:0
|
作者
Hirakawa, Rin [1 ]
Tominaga, Keitaro [2 ]
Nakatoh, Yoshihisa [1 ]
机构
[1] Kyushu Inst Technol, Kitakyushu, Fukuoka, Japan
[2] Panasonic Syst Design Co Ltd, Yokohama, Kanagawa, Japan
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In recent years, software in devices such as smartphones and tablets has become increasingly multifunctional, and the use of OSS has become essential. In software development using large-scale OSS, it is important to report defects to appropriate personnel promptly. In this paper, we propose a method to classifying defect reports into appropriate categories using fine-tuned BERT and visualize self-attention information. In the evaluation, category classification was performed using defect reports of the actual OSS project. The F1 score was 0.87, which indicated that high-accuracy classification was possible. Also, the visualization results show that category-specific words can be extracted.
引用
收藏
页码:60 / 61
页数:2
相关论文
共 50 条
  • [21] Automatic defect classification for yield management strategies
    ADE Corp, Westwood, United States
    Semicond Int, 3 (4pp):
  • [22] Automatic defect classification for effective yield management
    Breaux, L
    Kolar, D
    SOLID STATE TECHNOLOGY, 1996, 39 (12) : 89 - &
  • [23] Knowledge-based automatic defect classification
    Darwin, M
    Kinikoglu, P
    Liu, Y
    Darwin, K
    Clerico, J
    MICROLITHOGRAPHY WORLD, 2005, 14 (02): : 8 - 10
  • [24] SEM based automatic defect classification (ADC)
    Lakhani, F
    Tomlinson, W
    IN-LINE METHODS AND MONITORS FOR PROCESS AND YIELD IMPROVEMENT, 1999, 3884 : 306 - 313
  • [25] A study of the application of ontology to an FAQ automatic classification system
    Shaw, Ruey-Shiang
    Tsao, Chin-Feng
    Wu, Pei-Wen
    EXPERT SYSTEMS WITH APPLICATIONS, 2012, 39 (14) : 11593 - 11606
  • [26] Using Deep Learning ADC for Defect Classification for Automatic Defect Inspection
    Chi, Bryce
    Chen, Andy
    Chen, Jay
    Voots, Terry
    Wu, Maruko
    Kim, Cheolkyu
    Liu, Zhuan
    METROLOGY, INSPECTION, AND PROCESS CONTROL XXXVIII, 2024, 12955
  • [27] Defect detection and classification system for automatic analysis of digital radiography images of PM parts
    Ponomarev, M. G.
    Selcuk, C.
    Gan, T. -H.
    Amos, M.
    Nicholson, I.
    Iovea, M.
    Neagu, M.
    Stefanescu, B.
    Mateiasi, G.
    POWDER METALLURGY, 2014, 57 (01) : 17 - 20
  • [28] Visualization-Based Software Defect Prediction via Convolutional Neural Network with Global Self-Attention
    Qiu, Shaojian
    Wang, Shaosheng
    Tian, Xuhong
    Huang, Mengyang
    Huang, Qiong
    2022 IEEE 22ND INTERNATIONAL CONFERENCE ON SOFTWARE QUALITY, RELIABILITY AND SECURITY, QRS, 2022, : 189 - 198
  • [29] Automatic Classification and Visualization of Text Data on Rare Diseases
    Rei, Luis
    Costa, Joao Pita
    Draksler, Tanja Zdolsek
    JOURNAL OF PERSONALIZED MEDICINE, 2024, 14 (05):
  • [30] Visualization deep learning model for automatic arrhythmias classification
    Jiang, Mingfeng
    Qiu, Yujie
    Zhang, Wei
    Zhang, Jucheng
    Wang, Zhefeng
    Ke, Wei
    Wu, Yongquan
    Wang, Zhikang
    PHYSIOLOGICAL MEASUREMENT, 2022, 43 (08)