The nanofabrication of polydimethylsiloxane using a focused ion beam

被引：34

作者：

Guan, Li ^{[1
]}

Peng, Kaiwu ^{[1
]}

Yang, Yanlian ^{[1
]}

Qiu, Xiaohui ^{[1
]}

Wang, Chen ^{[1
]}

机构：

[1] Natl Ctr Nanosci & Technol, Beijing, Peoples R China

来源：

NANOTECHNOLOGY | 2009年 / 20卷 / 14期

基金：

中国国家自然科学基金;

关键词：

SURFACE MODIFICATION; MICROFLUIDIC DEVICE; POLY(DIMETHYLSILOXANE); FABRICATION; LITHOGRAPHY; POLYMERS; ELECTRON;

D O I：

10.1088/0957-4484/20/14/145301

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Nanofabrication on insulating and flexible films of polydimethylsiloxane (PDMS) using a focused ion beam (FIB) has been illustrated in this study. The charge accumulation effect, which is inevitable in polymeric fabrication, was shown to be relieved by simultaneously introducing electron beam flooding in the area exposed to FIB. The topography of the fabricated pattern is subsequently characterized by using an atomic force microscope (AFM), by which the dependence of height/depth of the fabricated arrays on ion beam dose could be obtained. In addition, the swelling effect and milling effect relating to focused ion beam dose could be identified in this study.

引用

页数：5

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