Creep deformation of directionally-solidified TiAl-based alloys with aligned lamellar microstructures

被引：0

作者：

Omiya, Y ^{[1
]}

Muto, S ^{[1
]}

Yamanaka, T ^{[1
]}

Johnson, DR ^{[1
]}

Inui, H ^{[1
]}

Yamaguchi, M ^{[1
]}

机构：

[1] Kyoto Univ, Dept Mat Sci & Engn, Sakyo Ku, Kyoto 6068501, Japan

来源：

PRICM 4: FORTH PACIFIC RIM INTERNATIONAL CONFERENCE ON ADVANCED MATERIALS AND PROCESSING, VOLS I AND II | 2001年

关键词：

TiAl; lamellar structure; directional solidification seeding; creep strength; tensile ductility;

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

By using an appropriately oriented seed from the TiAl-Si system, the TiAl/Ti3Al lamellar structure has been aligned parallel to the growth direction for ingots having compositions of Ti-46Al-0.5Si-0.5X (X = Re, W and Mo) and Ti-47.5Al-0.5Re (at.%). The seeded and directionally solidified quaternary alloys containing either Re, W or Mo exhibit a nice balance of low- and high-temperature mechanical properties. The creep resistance for the three quaternary alloys is more than an order of magnitude better than other relevant TiAl alloys produced by conventional ingot metallurgy methods, with the best creep properties being obtained for the Re-containing alloy. Tensile elongation more than 20 % is noted for the W- and Mo-containing alloys.

引用

页码：915 / 918

页数：4

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